Measuring device for electrically measuring a flat measurement structure that can be contacted on one side

Abstract

A measuring device for electrically measuring a measurement structure that can be electrically contacted at one measuring side, in particular an optoelectronic element, such as a solar cell, including at least two contacting units for electrically contacting the measurement structure and at least one support element for supporting the measurement structure with the measuring side on the support element. It is essential that the measuring device includes at least one suction line for the connection to the suction unit and at least one suction opening that is connected in a fluid-conducting manner to the suction line, wherein the suction opening is arranged in and / or on the support element such that the measurement structure can be pressed against the support element by suctioning via the suction opening. When the measurement structure rests on the support element, the contacting unit can be pressed against the measuring side of the measurement structure for the electrical contacting thereof.

Description

technical field [0001] The invention relates to a measurement structure for electrical measurement that can be electrically connected on a measurement surface on one side, in particular to a measurement device and method for electrical measurement of photoelectric elements such as solar cells. Background technique [0002] In photovoltaic elements and in particular solar cells, structures are known in which all contacts for electrical contacting are located on one measuring surface of the measuring structure. For testing purposes, therefore, it is necessary to electrically contact the measuring structure on one side at predefined contact contacts in the measuring device for calibration or measurement. Especially when the measuring structure is arranged on the side opposite the measuring surface for emitting or converting electromagnetic radiation, the following problems arise: On the one hand, the measuring surface is to be connected; On the one hand, the penetration of ele...

AI Technical Summary

Problems solved by technology

Especially when the measuring structure is arranged on the side opposite the measuring surface for emitting or converting electromagnetic radiation, the following problems arise: On the one hand, the measuring surface is to be connected; On the one hand, the penetration of electromagnetic radiation should be only minimally affected during the measurement or calibration process, because during the measurement or calibration process, the measurement structure needs to be loaded with electromagnetic radiation and / or it should be measured during the measurement process. electromagnetic radiation emitted

[0004] The disadvantage of this measuring device is that, on the one hand, the solar cells are laid flat on the carrier element and pressed together with the aid of a glass plate, which constitutes a complex process which requires, in particular when measuring several solar cells in a production line time consuming

On the other hand, the glass plates used have absorption and reflection properties which distort the measurement results or which must be calibrated accordingly in order to be taken into account in the measurement results

In addition, the glass plate can become contaminated or damaged during use, causing additional distortion during the measurement

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