Device for measuring high-temperature complex dielectric constants of dielectric material

Abstract

A device for measuring high-temperature complex dielectric constants of dielectric material belongs to the technical field of microwave testing, and comprises a vector network analyzer and a rectangular waveguide resonant cavity, wherein the rectangular waveguide resonant cavity is formed by connecting a radiating waveguide, a thermal insulation waveguide, a high-temperature waveguide and a short-circuit flange plate in sequence; a structure of a groove with rectangular sections is arranged at one side of the short-circuit flange plate, facing to the interior of the rectangular resonant cavity and is used for bearing samples of detected media; and a choke type flange structure is formed at the connection part between the high-temperature waveguide and the short-circuit flange plate. In the device, a structure that a high-temperature waveguide is contacted with a metal short-circuit plat in the existing device for measuring the high-temperature complex dielectric constants of the dielectric material is changed to be the choke type flange structure that the high-temperature waveguide is connected with the short-circuit flange plate; and the device has the advantages that the operation is convenient, and the costs for use and maintenance are low, and simultaneously, can ensure the good electric contact between a terminal short circuit surface and the waveguides, thereby ensuring the accuracy of testing results.

Description

technical field [0001] The invention belongs to the technical field of microwave testing, and relates to a method and system for measuring the complex dielectric constant of dielectric materials by terminal short-circuit method, in particular to a system for measuring high-temperature complex dielectric constants of dielectric materials. Background technique [0002] As high-temperature dielectric materials are more and more widely used in aerospace, military equipment and other fields, the requirements for their microwave performance are also getting higher and higher. The complex dielectric constant and its temperature characteristics are an important parameter to measure the microwave performance of high-temperature dielectric materials. Therefore, when researching and applying high-temperature dielectric materials, it is necessary to test the temperature characteristics of the material's complex dielectric constant in a high-temperature environment. [0003] The termina...

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Problems solved by technology

Shorting boards and high temperature waveguides cannot be reused after this happens

The usual practice is to completely replace the short-circuit board and high-temperature waveguide. Due to the high cost of materials and processing of the short-circuit board and high-temperature waveguide, completely replacing the short-circuit board and high-temperature waveguide will result in high test costs and inconvenient operation; in addition, under high temperature conditions, The waveguide will be deformed due to uneven heating. Even if the short-circuit board and the high-temperature waveguide can be cleaned, it cannot ensure that the short-circuit surface and the waveguide always have good electrical contact, which will affect the accuracy of the test results.

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