Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device

一种高保真度、激光脉冲的技术，应用在激光领域，能够解决信噪比失真、假信号复杂等问题，达到信噪比单的效果

Inactive Publication Date: 2012-04-25
FUDAN UNIV
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Problems solved by technology

These spikes not only increase the height of the background near it, but also mask the true structure of the pulse under test there, resulting in distortion of the signal-to-noise ratio measurement
Aliasing in single-shot mode is compounded by "time-space" encoding and imaging from the cross-correlation crystal to the detector

Method used

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  • Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device
  • Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device
  • Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device

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Embodiment Construction

[0019] Further describe the present invention below in conjunction with accompanying drawing.

[0020] figure 1 Shown is a QPM-based laser pulse high-fidelity signal-to-noise ratio single measurement device designed according to the present invention. The device includes three parts: a sampling light generating unit, a high-fidelity non-collinear sum-frequency cross-correlation unit and a high-sensitivity signal receiving unit.

[0021] The pulse laser 2 emitted by the near-infrared laser source 1 is divided into two parts by the first beam splitter 3: one part of the laser is used to pump the pulse laser 4 of the OPG-OPA system, which can be further used to generate long-wavelength sampling light, and the other part The laser is used as the laser 21 to be measured.

[0022] The sampling light generating unit mainly includes a first beam reducer 6 , a second beam reducer 13 , an OPAG-OPA system, a first retarder 14 , and a first filter 9 . The OPG-OPA system consists of a ...

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Abstract

The invention belongs to the technical field of laser, and particularly discloses a quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device. The device mainly comprises three parts, namely a sampling light generation unit, a high-fidelity collinear sum frequency correlation unit and a high-flexibility signal receiving unit. The invention provides a special crystal design which is introduced into the signal-to-noise ratio single measurement device as a nonlinear correlation crystal; two types of ghost signals introduced by a correlation process are transferred out of a window and a main pulse respectively; and thus, the influence of the ghost signals on a measurement result is eliminated, fidelity single measurement of signal-noise-ratio at the pulse front edge is realized, meanwhile, obvious influence is not produced on other parameters of the measurement device. The device can be suitable for signal-to-noise measurement of high-power laserof various wavelengths.

Description

technical field [0001] The invention belongs to the field of laser technology, and in particular relates to a device for single-time measurement of pulse signal-to-noise ratio. Background technique [0002] The time contrast of the pulse (that is, the signal-to-noise ratio) is one of the main challenges faced by the high-intensity femtosecond chirped pulse amplifier. It not only requires the design of a more sophisticated laser system and pulse purification technology, but also requires the measurement of the pulse signal-to-noise ratio. challenge. The pulse signal-to-noise ratio measurement is mainly based on nonlinear correlation technology, that is, a clean sampling pulse and the pulse to be measured are used for cross-correlation in the form of sum frequency (SFG) or difference frequency (DFG) in a nonlinear crystal, and the sum obtained by measurement The signal-to-noise ratio curve of the pulse to be measured can be obtained by analyzing the dependence of the frequenc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 钱列加王永志袁鹏马金贵谢国强
Owner FUDAN UNIV
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