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Polarization test method and polarization test system of semiconductor laser

A test method and test system technology, which is applied in the direction of testing optical performance, etc., can solve the problems of inability to judge the polarization mode, difficulty in testing the degree of polarization of high-power semiconductor lasers, and the inability of polarizers to withstand high-power lasers, etc., to achieve good accuracy and repeatability Good results

Active Publication Date: 2014-06-04
FOCUSLIGHT TECH
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0007] "Experimental Research on the Polarization Characteristics of Semiconductor Laser Array and Its Relationship with Stress" (Vol.36, No.5, May, 2009) in "China Laser" introduced a test method for the polarization characteristics of semiconductor laser arrays, which is a laser beam or The fluorescent beam under the threshold passes through the polarizer and shines on the CCD camera, then rotates the polarizer 90°, records the result, and obtains the value of the degree of polarization. This method cannot judge the polarization mode, and the polarizer cannot withstand high-power lasers, so it is difficult to test Polarization degree of high power semiconductor laser

Method used

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  • Polarization test method and polarization test system of semiconductor laser
  • Polarization test method and polarization test system of semiconductor laser
  • Polarization test method and polarization test system of semiconductor laser

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Embodiment 1

[0031] like figure 2 shown, figure 2 It is a schematic diagram of the structure of the first embodiment of the present invention. The laser beam emitted by the semiconductor laser is subjected to fast axis compression and convergence by a cylindrical lens and then incident on a polarization beam splitter. The polarization beam splitter adopts a polarization cube beam splitter to transmit the P-state polarized light, while the S polarized light is reflected. Use a power detector and a multimeter to test the optical power of the transmitted light and the S-reflected light respectively. The larger optical power is recorded as Pmax, and the smaller power is recorded as Pmin. The calculated polarization degree of the semiconductor laser is (Pmax-Pmin) / (Pmax+ Pmin), Figure 4 According to the result of the power test of this embodiment, the power of the semiconductor laser tested in this embodiment is about 40W, Figure 5 According to the polarization degree test result of this...

Embodiment 2

[0033] like image 3 shown, image 3 It is a schematic diagram of the structure of the first embodiment of the present invention. The laser beam emitted by the semiconductor laser is compressed and converged by the fast axis and the slow axis respectively through the spherical lens and the aspheric lens, and then is incident on the polarization beam splitting device. The polarization beam splitting device adopts a polarization cube beam splitter, so that P S-state polarized light is transmitted, while S-state polarized light is reflected. Use a power detector and a multimeter to test the optical power of the transmitted light and the S-reflected light respectively. The larger optical power is recorded as Pmax, and the smaller power is recorded as Pmin. The calculated polarization degree of the semiconductor laser is (Pmax-Pmin) / (Pmax+ Pmin), Image 6 The power test result of this embodiment shows that the power of the semiconductor laser tested in this embodiment is about 60...

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Abstract

The invention provides a polarization test method and a polarization test system of a semiconductor laser, so as to accurately test the polarization degree and the polarization model of the semiconductor laser. The polarization test method has the scheme that light beams emitted by the semiconductor laser are compressed and converged and then enters into a polarization light splitting device, and light is split to form transmission light and reflected light according to polarization states; the transmission light power Pmax and the reflected light power Pmin are respectively read; and the polarization degree of the semiconductor laser is calculated and obtained to be (Pmax minus Pmin) / ( Pmax plus Pmin).

Description

technical field [0001] The invention relates to a semiconductor laser polarization testing method and a testing system thereof, in particular to polarization testing of high-power semiconductor lasers. Background technique [0002] High-power semiconductor lasers are widely used in many fields such as medical treatment and industrial processing due to their small size, high efficiency, long life, high power and many other advantages. Packaging quality is an important factor affecting the quality of semiconductor lasers. [0003] As an important process in laser production, chip packaging process is an important limiting factor for the application of high-power semiconductor lasers. Its quality seriously affects the output characteristics of semiconductor lasers, such as the power, wavelength, and polarization characteristics of the device, as well as the reliability and reliability of semiconductor lasers. life. [0004] However, in the packaging process of the semiconduct...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 刘兴胜吴迪周国锋
Owner FOCUSLIGHT TECH