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Comparison device for verifying capacity of phase noise in Ka wave band

A phase noise and proficiency verification technology, which is applied in the measurement device, the phase angle between voltage and current, and the automatic control of power. and other problems, to achieve the effect of improving confidence, ensuring quality, and high power of high-order spectral lines.

Inactive Publication Date: 2014-01-08
中国航天科工集团第二研究院二〇三所
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Problems solved by technology

[0005] The purpose of the present invention is to provide a comparison device for Ka-band phase noise capability verification, which solves the problem that in the Ka-band verification of phase noise testing capabilities, the performance of the down converter is not verified, and each laboratory participating in the capability verification uses The intermediate frequency reference sources with different performance indicators lead to discrete measurement data, and the step diode SRD has problems with poor noise at the bottom of the comb spectrum and low power of high-order spectral lines

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  • Comparison device for verifying capacity of phase noise in Ka wave band

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Embodiment Construction

[0017] A comparison device for Ka-band phase noise capability verification, including: high-stable crystal oscillator source A1, high-stable crystal oscillator source B9, phase noise measurement device 8, and also includes: frequency multiplier A2, phase-locked loop A3, low Noise voltage-controlled oscillator A4, isolation amplifier A5, intermediate frequency source 6, frequency multiplier B7, frequency multiplier C10, phase-locked loop B11, low-noise voltage-controlled oscillator B12, isolation amplifier B13, frequency multiplier D14, comb Spectrum generator 15 , PIN switch combination 16 , bandpass filter combination 17 , power amplifier combination 18 , microwave source 19 , and Ka-band downconverter 20 .

[0018] The voltage-controlled input end of the high-stable crystal oscillator source A1 is connected with the voltage-controlled output end radio frequency cable of the phase noise measurement device 8, the output end of the high-stable crystal oscillator source A1 is con...

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Abstract

The invention discloses a comparison device for verifying a capacity of a phase noise in a Ka wave band. The comparison device comprises a high-stability crystal oscillator source A (1), a high-stability crystal oscillator source B (9), a phase noise measuring device (8), a frequency multiplier A (2), a phase-locked loop A (3), a low-noise voltage-controlled oscillator A (4), an isolating amplifier A (5), a medium frequency source (6), a frequency multiplier B (7) and a frequency multiplier C (10). A transmitting standard is applied to a capacity verifying activity of phase noise measurement and the result is utilized to objectively verify and evaluate the technical capacity of phase noise measuring test of a laboratory. The comparison device has important realistic significances for ensuring the quality of a phase noise measuring result, promoting reliability and verifying and monitoring the sustaining capacity of the laboratory.

Description

technical field [0001] The invention relates to a comparison device for phase noise capability verification, in particular to a comparison device for Ka-band phase noise capability verification. Background technique [0002] The current phase noise measurement devices on the market mainly include imported HP3047A, HP3048A, E5500 series and PN9000, etc. The components of these devices mainly include: microwave source, high stability crystal oscillator source, and phase noise measurement device. [0003] For such a large, precise, and complex measurement system, when measuring the same transfer standard, there may be large dispersion in the phase noise measurement results obtained by different phase noise measurement systems. In the past, the comparison measurement of phase noise parameters was carried out to solve the problem that the phase noise measurement system cannot be traced. The frequencies of the comparison samples are 10MHz and 10GHz, of which the 10MHz crystal osc...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/165G01R25/00H03L7/085
Inventor 阎栋梁王学运杨军韩红柳丹
Owner 中国航天科工集团第二研究院二〇三所