Imaging system using plane mirror to integrate lights and optical measuring device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- INST OF MICROELECTRONICS CHINESE ACAD OF SCI
- Publication Date
- 2013-05-22
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the technical field of optical measurement, and in particular to an imaging system and an optical measurement device that combine light using a plane mirror. Background technique
[0002] In the optical measurement system, it is usually necessary to observe the surface structure of the target sample and the shape and position of the probe beam on the sample surface; imaging system. To realize the measurement of the specified position on the sample surface, the imaging system is required to be able to simultaneously observe the sample surface structure and the position of the probe beam spot on the sample surface, so as to realize the calibration of the probe beam and the specified measurement position. In addition, the imaging system with integrated image recognition function can realize the automatic recognition and calibration of the same repeated structure on the sample surface, so as to realize the automation of measuremen...