Failure analysis method

A failure analysis, a part of the technology, applied in the field of failure analysis, can solve problems such as poor effectiveness and low success rate of failure analysis work, and achieve strong accuracy and persuasion.

Inactive Publication Date: 2012-06-13
苏州华碧微科检测技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In order to solve the existing failure analysis work, the effectiveness of cause determination is poor, and the success rate of failure analysis work is low, the present invention provides the following technical solutions:

Method used

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Examples

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Embodiment 1

[0030] Example 1: A certain unit needs to conduct failure analysis on mobile phones with automatic dialing problems, and provides 6 defective samples (numbered F1~F6) and 5 reference samples (numbered R1~R5) respectively. Among the defective samples , The phenomenon of R6 is automatic dialing all the time, that is, the number 6, 7, and 8 keys automatically dial after the mobile phone is turned on, the sequence is uncertain, the frequency is uncertain, until the mobile phone is automatically shut down when the battery is out, and the defective product samples F1~F5 occasionally appear when testing. 6, 7, 8 keys automatically dial phenomenon.

[0031] Conduct preliminary non-destructive testing and failure location. Bake the defective samples in an environment of 85°C for 45 minutes, cool to room temperature, and after the mobile phone is powered on, the phenomenon of automatic dialing still exists, which shows that the factor of automatic dialing still exists. Remove the s...

Embodiment 2

[0044] Example 2: A certain unit requires failure analysis of the LED digital tube samples it provided. The unit provided a total of 12 samples, including 6 defective samples and 6 unused reference samples. The background of the failure is that after the LED digital tube has been packaged and stored for several months, there are defects when it is used by the client, which manifests as abnormal phenomena such as LED lights not lighting, broken codes, and garbled codes, with a defect rate of 11.7%.

[0045] Firstly, the non-destructive analysis was carried out in the early stage, and the appearance optical inspection was carried out on the defective product samples and the reference samples respectively, and no abnormal phenomenon was found; the electrical tests were carried out on the defective product samples and the reference samples respectively, and the tests showed that the I / V curves of the six defective product samples were abnormal; Carried out X-ray detection, no a...

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Abstract

The invention relates to the field of failure analysis and provides a failure analysis method. The failure analysis method comprises the following steps of: A, receiving good product samples and defective product samples; B, concluding and summarizing the failure background and failure phenomena of the defective product samples; C, performing preliminary nondestructive analysis and failure location summary on the defective product samples, and determining the comparison characteristics; D, designing an analysis scheme; E, analyzing according to the designed analysis scheme, and determining whether comparison characteristics exist or not respectively; and F, determining the characteristics of physical evidence according to the exitance conditon of the comparison characteristics in the good product samples and the defective product samples, and determining the specific failure reasons of the defective product samples. According to the method provided by the invention, the 'principle of identification', 'principle of relativity', 'principle of materiality' and 'principle of information transfer' in the field of law are applied to the failure analysis, and the whole failure analysis processes are integrated according to the principle of law, so that mutual verification can be realized among the scattered evidences to obtain a conclusion with greater accuracy and persuasion.

Description

[0001] technical field [0002] The invention relates to a failure analysis method. [0003] Background technique [0004] The loss of the specified function of the product is called failure, and the technical and management activities of judging the mode of failure and finding the cause and mechanism of failure are called failure analysis. In common circuit failure analysis cases, many failure cases are faced with the dilemma of proving the cause of failure, that is, how to use the work results in failure analysis to convince others, which leads to the failure of failure analysis work, thereby reducing the effectiveness of failure cause determination. sex. [0005] Therefore, how to improve the effectiveness of failure analysis cause determination and improve the success rate of failure analysis work has become an urgent problem in the field of failure analysis. [0006] Contents of the invention [0007] In order to solve the existing failure analysis work, the effec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/26G01N21/88G01N23/22H04M1/24
Inventor 刘学森
Owner 苏州华碧微科检测技术有限公司
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