Graphical test method of semiconductor devices

Abstract

The invention discloses a graphical test method of semiconductor devices. A test program is divided into a top layer, a test index layer and a programming module layer, wherein the top layer testing process is formed by test indexes; the test index layer is formed by programming modules according to a semiconductor test step; and the programming module layer corresponds to operation and needed parameters of the step. When the test program is developed, only the test indexes are set for each semiconductor device, and each test index sets up a sub process; then, in a graphical parameter setting interface, the programming module corresponding to each step in the process sets one parameter; after completing, the programming module automatically generates a test, and the text is explained to a C source program and is compiled into an ARM (Advanced RISC Machines) executable file; then the ARM executable file is downloaded through a USB (Universal Serial Bus) to a tester for operation; and finally the semiconductor devices are tested. The development convenience is increased, the development cycle is shortened at the same time, and the maintainability of the test program is enhanced.

Description

technical field [0001] The invention belongs to the technical field of semiconductor device testing, and more specifically relates to a patterned testing method for semiconductor devices. Background technique [0002] In the 1950s, the transistor was invented, and semiconductor device testing technology came into being. Today, the semiconductor industry is an important pillar industry to measure the country's comprehensive strength. In the semiconductor industry chain, testing is the only industry that runs through the entire process of production and application. [0003] The demand for semiconductor devices is huge, so how to ensure whether the characteristic parameters of semiconductor devices meet the standards during mass production has become one of the bottlenecks for measuring the production strength and production efficiency of various manufacturers. However, there are many types and models of semiconductor devices, and the corresponding test indicators range from...

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Problems solved by technology

[0004] In the prior art, high-level languages ​​such as C / C++ / C# / Java etc. are used to write a set of special test programs for each semiconductor device. Although these high-level languages ​​are powerful and flexible, there are deficiencies in the use of the testing technology field. Disadvantage: For a semiconductor, the test program is written in a high-level language, which is poor in convenience, long in development cycle and low in maintainability

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