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Sample temperature changing device of atomic force microscope

A technology of atomic force microscope and variable temperature device, which is applied in the direction of measuring device, scanning probe microscope, instrument, etc., to achieve the effect of strong practicability, convenient temperature variable experiment, and simple structure

Inactive Publication Date: 2012-07-04
SHANGHAI NAT ENG RES CENT FORNANOTECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the usual AFM testing process, each measurement can only test the surface structure and properties of the sample to be tested at room temperature, and the two cannot be quickly tested at different temperatures Measurement of the surface structure and properties of the lower sample

Method used

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  • Sample temperature changing device of atomic force microscope
  • Sample temperature changing device of atomic force microscope

Examples

Experimental program
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Effect test

Embodiment 1

[0013] Embodiment one: As shown in the figure, this simple atomic force microscope sample temperature changing device includes: a heat shield 1 and a constant temperature block 2; the heat shield 1 is placed on the sample stage of the atomic force microscope, and the constant temperature block 2 is placed on the top of the heat shield. The test sample is placed directly on the constant temperature block.

Embodiment 2

[0014] Embodiment two: This embodiment is basically the same as the first embodiment, and the special features are as follows: the thermostatic block 2 is provided with a circulating liquid channel, and is provided with a circulating liquid inlet 3 and a circulating liquid outlet 4 . The circulating liquid inlet 3 and the circulating liquid outlet 4 are on the same side of the thermostatic block 2 . The thermostatic block 2 is fixed to the sample stage of the atomic force microscope by the screw 5 and at the same time, the heat shield 1 is fixed to make it close. The material of the thermostatic block 2 is stainless steel, or aluminum, or copper. The heat insulation board 1 is made of Teflon or rubber.

[0015] When preparing for the experiment, connect the outlet and inlet pipes of the circulating liquid bath and the liquid inlet 3 and liquid outlet 4 of the circulating liquid channel (U-shaped channel) of the thermostatic block respectively, and then use screws 5 to f...

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Abstract

The invention relates to a simple sample temperature changing device of an atomic force microscope, which comprises a heat insulating board and a constant temperature block; the heat insulating board is arranged on a sample platform of the atomic force microscope; the constant temperature block is arranged on the heat insulating board and fixed to the sample platform of the atomic force microscope; a sample is directly arranged on the constant temperature block; and the constant temperature block is made of a heat conducting metal material. According to the invention, the temperature of a loaded sample can be changed; and tests of the surface structure and the nature of the sample at different temperatures can be conveniently and quickly conducted. The complete set of device has the advantages of simple structure, convenience for operation and strong practicability.

Description

technical field [0001] The invention relates to a sample temperature changing device in an atomic force microscope, in particular to a sample temperature changing device for an atomic force microscope. Background technique [0002] In the usual atomic force microscope testing process, each measurement can only test the surface structure and properties of the sample to be tested at room temperature, and it cannot quickly measure the surface structure and properties of the sample at different temperatures. Contents of the invention [0003] The purpose of the present invention is to provide a simple atomic force microscope sample temperature changing device that can conveniently and quickly test the surface structure and properties of samples at different temperatures. [0004] To achieve the above object, the solution of the present invention is: [0005] A sample temperature changing device for an atomic force microscope, comprising a constant temperature block and a h...

Claims

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Application Information

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IPC IPC(8): G01Q60/24
Inventor 熊丹钟建施妍玲沈霞张柯何丹农
Owner SHANGHAI NAT ENG RES CENT FORNANOTECH