Low-frequency error measuring method for star sensor

A star sensor and low-frequency error technology, which is applied in the field of star sensor error measurement and star sensor low-frequency error measurement, can solve the problem of no low-frequency error, etc., and achieve the effect of improving measurement accuracy

Active Publication Date: 2012-07-11
BEIJING INST OF CONTROL ENG
View PDF3 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the limitation of test conditions, currently domestic star

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Low-frequency error measuring method for star sensor
  • Low-frequency error measuring method for star sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Such as figure 1 As shown, the dotted line on the left side of the figure is a bell-type vacuum simulation equipment system, which is composed of a vacuum bell, a shock isolation table, a three-dimensional translation and a two-dimensional rotation device, figure 1 The dotted line on the middle right side is the measurement equipment, which is composed of the self-collimating collimator 1, the static multi-light path star simulator 2, the adjustment bracket 3, the measurement system 4 and the laser aligner 5, and the adjustment bracket 3 is used for Align the self-collimating collimator 1 with the reference mirror of the star sensor, and align the static multi-optical path star simulator 2 with the optical axis of the star sensor; the self-collimating collimator is used to measure the rotation angle of the reference mirror, and the star needs to be simulated during the test. The main optical axes of the autocollimator 2 and the collimator 1 are respectively aligned with...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a low-frequency error measuring method for a star sensor, and builds a low-frequency error measuring system comprising an auto-collimating collimator, a static multi-optical path star simulator, an adjusting bracket, a measuring system and a laser sight, wherein the star sensor is mounted on a vibration isolation table; a vacuum bell jar is used for providing a vacuum environment for the star sensor; a glass window is arranged on the vacuum bell jar; the transmittivity of the glass window is not less than 95 percent; and the star point imaging positions of the star sensor and the auto-collimating imaging positions of an optical datum mirror are monitored and measured at different temperatures under vacuum conditions, so as to fulfill the measuring of the low-frequency error of the star sensor. The invention further provides a measuring system to analog fixed stars of different spectra independently or simultaneously while measuring the auto-collimating angle of the optical datum mirror, and monitor and measure the star point imaging positions of the star sensor and the auto-collimating imaging positions of the optical datum mirror, so as to improve the measuring accuracy.

Description

technical field [0001] The invention relates to a method for measuring the error of a star sensor, in particular to a method for measuring the low-frequency error of a star sensor, and belongs to the technical field of testing. Background technique [0002] With the gradual development of star sensor products and the gradual increase in the requirements for attitude accuracy, the low-frequency error of star sensors has become an important factor restricting the development of star sensors. The cause analysis and testing of low-frequency errors have attracted great attention , the low-frequency error is an important error source for the star sensor to affect the satellite attitude measurement accuracy, which mainly includes two parts: the field-of-view related error and the thermal influence error. The low-frequency error includes the main error characteristics of the star sensor's output attitude, such as field of view space error, pixel space error, time domain error, and t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01C25/00
Inventor 李春艳卢欣钟红军武延鹏黄欣赵春晖张巍李春江李玉明宋彧严微
Owner BEIJING INST OF CONTROL ENG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products