Testing system and discharging device thereof

Abstract

The invention relates to a testing system and a discharging device thereof. The testing system comprises at least one power supply module, a testing machine station and a discharging device, wherein the power supply module is used for supplying a power supply to an element to be tested; the testing machine station is connected with the element to be tested to perform a plurality of electrification testing programs on the element to be tested; the discharging device comprises at least one first fixed-current discharging unit, at least one second fixed-current discharging unit and a control module; the first fixed-current discharging unit is correspondingly arranged in the testing machine station; the second fixed-current discharging unit is arranged in the power supply module; and the control module is used for controlling the first and second fixed-current discharging units to absorb fixed current from the element to be tested and the power supply module respectively after any one of the electrification testing programs is completed to perform a discharging process. Due to the adoption of the technical scheme provided by the invention, quick discharge is realized, the time consumption of a testing flow is lowered, and high practicability is achieved.

Description

technical field [0001] The invention relates to a test system of an electronic device, in particular to a test system and a discharge device thereof. Background technique [0002] In the process of testing electronic components, it includes the parts of no-power test and power-on test. In the test process, the power-on test often accounts for half of the overall test process. At the end of each program of the power-on test process, it needs to be discharged first to ensure that there is no excessive residual charge still in the device under test, so as to avoid damage to the device under test caused by excessive current when the next program starts to power on . Therefore, in a power-on test process, many discharges are required, and the longer the discharge time, the greater the impact on the time course of the power-on test process. [0003] In the past, many resistors with different resistance values ​​were often used, and the voltage value of the component under test ...

AI Technical Summary

Problems solved by technology

However, in this way, sometimes the size of the discharge current cannot be accurately controlled, and it is easy to make the discharge current too small and affect the discharge speed.

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