Test system for radio frequency index

A technology for testing systems and indicators, applied in transmission systems, transmitter monitoring, transmission monitoring, etc., can solve problems such as low efficiency, eliminate the impact of RRU performance, and improve test efficiency

Inactive Publication Date: 2012-07-11
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] At present, for most FDD LTE equipment suppliers, the uplink radio frequency index and downlink radio frequency index are time-sharing tests, which are inefficient

Method used

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  • Test system for radio frequency index
  • Test system for radio frequency index
  • Test system for radio frequency index

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] Carry out the test system that the uplink and downlink indicators are tested simultaneously as shown in Figure 3 (a), the composition of the test system of the present embodiment is as follows:

[0042] The common port (Port1) through which the downlink and uplink signals of a multiplexer pass is connected to an antenna port of the eRRU (evolved RRU), and the bandpass filter interface (Port2) of the multiplexer is connected to an attenuator, which is connected to the attenuator A spectrum analyzer is connected, and the two band rejection filter interfaces (Port3 and Port4) of the multiplexer are respectively connected with two output ports of a vector signal generator.

[0043] The EPC in the figure is the core network), the eBBU is the base station resource pool, and the OMC is the operation and maintenance center.

[0044] In this embodiment, the downlink signal of the base station passes through Port1 to Port2 of the triplexer, and then passes through the attenuator ...

Embodiment 2

[0049] Embodiment 2, when the interference signal falls outside the TX frequency band, the test system for testing the block index under the TX rated power is shown in FIG. 3( a ).

[0050] In this embodiment, the TX signal reaches the rated power, and the signal source sends out an interference signal that is greater than the predetermined power and does not fall within the TX frequency band, so as to perform the blocking index test under the condition that the downlink signal reaches the rated power.

[0051] In this embodiment, the attenuator can be adjusted so that the power entering the spectrum analyzer is within the allowable range, so that the rated power of the TX will not cause damage to the spectrum analyzer.

[0052] Due to the stop band of the TX signal in the multiplexer, the TX rated power cannot pass through Port1 to Port3 and Port4 to cause damage to the signal source, so the TX high-power signal will not enter the signal source.

[0053] In this embodiment, t...

Embodiment 3

[0054] Embodiment 3, when the interference signal falls in the TX frequency band, test the test system of the block index under the TX rated power, as shown in Figure 3 (b), the structure of the test system of the present embodiment is as follows:

[0055] The port (Port1) through which the downlink and uplink signals of a multiplexer pass is connected to an antenna port of the RRU, the bandpass filter interface (Port2) of the multiplexer is connected to a circulator, the circulator is connected to an attenuator, and the attenuator Connect with a spectrum analyzer, one port (A) of the vector signal generator is connected with the band-stop filter interface (Port3) of the multiplexer through the attenuator, and the other port (B) of the vector signal generator is connected with the circulator , the other band-stop filter interface (Port4) of the multiplexer is connected to a matching load.

[0056] In this embodiment, the downlink signal of the base station passes through Port1...

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Abstract

The invention provides a test system for a radio frequency index. The test system comprises a multiplexer, a RRU (Radio Remote Unit), a tester and a signal source, wherein a common port of the multiplexer is connected with an antenna port of the RRU; one or more band-pass filter ports in the multiplexer are connected with the tester through a first attenuator and is used for testing a radio frequency index of a downlink signal; a first output port of the signal source is directly connected with a first band-rejection filter port in the multiplexer and is used for outputting an uplink interference signal; and a second output port of the signal source is connected with a second band-rejection filter port in the multiplexer through a second attenuator and is used for outputting an uplink useful signal and testing the radio frequency index of the uplink signal. By adopting the test system for the radio frequency index, the simultaneous test for uplink and downlink indexes is realized, the block index test is performed under TX rated power, the influence of test environment on the RRU performance is eliminated, and the test efficiency is increased.

Description

technical field [0001] The invention relates to wireless communication equipment testing, in particular to a testing system for radio frequency indicators of FDD (Frequency Division Duplexing, frequency division duplexing) LTE (Long Term Evolution, long term evolution) base stations. Background technique [0002] The radio frequency unit (RRU) in the base station is an essential part of all wireless communication systems, and its performance affects the entire system. Only through testing can it be verified whether its performance has reached the design goal. [0003] In November 2011, the 3GPP (Third Generation Partnership Project) organization has passed the FDD LTE uplink sensitivity index and some blocking interference points (the second / third harmonic of the downlink signal and the interference signal fall within the uplink band) need to be in the downlink Launch the test in E-TM1.1 mode. [0004] Laboratory sensitivity test environment such as figure 1 , the uplink s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00
CPCH04B17/00H04B17/16
Inventor 成军平田宏余飞张天鹏刘彬张志锋邵立群
Owner ZTE CORP
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