Thickness compensation type measuring device for SPAD
A chlorophyll meter and thickness compensation technology, which is applied in measuring devices, electromagnetic measuring devices, electric/magnetic thickness measurement, etc., can solve the problems of large readings and errors, and achieve the effects of convenient measurement, high precision, and stable flow accuracy
Inactive Publication Date: 2012-10-03
CHINA JILIANG UNIV
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Problems solved by technology
Some studies have found that when using the chlorophyll meter SPAD, it is necessary to consider the influence of leaf thickness on the SPAD readings. If the leaf thickness is large, the readings will be too large, resulting in errors
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Embodiment Construction
[0020] The present invention will be further described below in conjunction with accompanying drawing.
[0021] Such as figure 1 As shown, the present invention includes a thickness-compensating chlorophyll meter clamp device including an inductance sensor 1, tightening screws M2 2, nuts M2 3, cylindrical pin 4, clamp bottom plate 5, linear slide rail 6, clamp lower arm 7, compression spring 8, Fixture upper arm 9, supporting stud M2 10, measuring head lifting rod 11, lens group 12, optical sleeve screw cover 13, 650nm laser diode 14, 940nm laser diode 15, optical sleeve 16, leveling stud M5 17, nut M5 18, gasket M2 19 and signal processing circuit.
[0022] Linear slide rails 6 are arranged symmetrically on both sides of the fixture bottom plate 5, and the lower arm 7 of the fixture slides and cooperates with the fixture bottom plate 5 through the linear slide rails 6; an inductance sensor 1 and an up and down adjustable platform are arranged on the front side of the fixture...
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The invention discloses a thickness compensation type measuring device for an SPAD (Soil and Plant Analyzer Development). Linear slide rails are symmetrically arranged on two sides of a clamp baseplate, and a lower clamp arm is in sliding fit with the clamp baseplate through the linear slide rails; an inductive transducer and a vertically-adjustable platform are arranged on the front side of the lower clamp arm; a hinge mount is fixedly arranged on the rear side of the lower clamp arm, an upper clamp arm is hinged with the hinge mount, a light sleeve is arranged at one end of the upper clamp arm, and the bottom end of the light sleeve is in threaded fit with the upper clamp arm; the other end of the upper clamp arm is suspended in midair, and a return mechanism is arranged close to the suspended end; 650mm laser diodes and 940mm laser diodes are arranged in the top end of the light sleeve side by side, and a lens group is arranged in the bottom end of the light sleeve; and a circular groove is formed on the lower clamp arm corresponding to the lens group and provided with a photoelectric receiver. The thickness compensation type measuring device integrates thickness measurement and chlorophyll measurement and is convenient in measurement, simple in operation and high in precision.
Description
technical field [0001] The invention belongs to the technical field of test and measurement, and in particular relates to a thickness compensation type chlorophyll meter measuring device. Background technique [0002] The content of chlorophyll in plant leaves is closely related to nitrogen. 70% to 80% of nitrogen in plant leaves exists in chloroplasts, so chlorophyll content can reflect the nitrogen nutrition status of plants. Therefore, the content of nitrogen element in plants can be determined by detecting the content of chlorophyll in leaves, and it can be used as the basis for topdressing nitrogen fertilizer. Nowadays, the chlorophyll meter has become a common tool for measuring the chlorophyll content of plants, and is widely used in scientific research and agricultural manufacturing industries, conforming to the trend of precision agriculture. The existing chlorophyll meter (SPAD-502) is affected by various factors such as variety, growth period, environmental facto...
Claims
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IPC IPC(8): G01N21/17G01B7/06
Inventor 李东升方波郭冲冲陈爱军刘月瑶
Owner CHINA JILIANG UNIV