Method for removing time base flutter of high-speed sampling oscilloscope

An oscilloscope, high-speed technology, used in instruments, measuring devices, measuring electrical variables, etc., can solve problems affecting test results, time base jitter, etc., to achieve accurate data processing, good removal effect, and obvious debounce effect.

Inactive Publication Date: 2012-10-03
BEIJING UNIV OF TECH
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Problems solved by technology

In precision measurement, when the high-speed oscilloscope samples the signal, the measurement results more or less have time base jitter, which seriously affects the test results

Method used

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  • Method for removing time base flutter of high-speed sampling oscilloscope
  • Method for removing time base flutter of high-speed sampling oscilloscope
  • Method for removing time base flutter of high-speed sampling oscilloscope

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Embodiment Construction

[0030] The preferred embodiments will be described in detail below in conjunction with the accompanying drawings. It should be emphasized that the following description is only exemplary and not intended to limit the scope of the invention and its application.

[0031] Provide the best embodiment of the present invention below in conjunction with accompanying drawing:

[0032] (1) Connect the Picosecond4016 signal source and the Aglient86100C broadband 70GHz sampling oscilloscope 86118A with a connector. The signal source generates a negative step pulse signal with a nominal value of 5ps. The high-speed sampling oscilloscope samples the signal source once and imports the sampled data into the computer. The hardware connection is as follows: figure 2 shown.

[0033] (2) Draw the time-domain diagram of the signal to be analyzed by computer. The signal waveform is a discontinuous strip, that is, it is considered that the time base jitter causes the original signal to be super...

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Abstract

The invention provides a method for removing time base flutter of a high-speed sampling oscilloscope, which relates to the data processing field of instruments and meters. The method is characterized in that an EEMD (Ensemble Empirical Mode Decomposition) method is used to decompose in the data processing process, IMF (Intrinsic Mode Function) components are subjected to frequency-domain analysis to screen the useful signal, and the noise signals are removed to reconstruct the new signals, thereby realizing the effect for removing the time base flutter.

Description

technical field [0001] The invention relates to a method for removing time base jitter of a high-speed sampling oscilloscope, belonging to the field of data processing of instruments and meters. Background technique [0002] For high-speed sampling oscilloscopes with a bandwidth of 10 GHz and above, time base jitter will occur during signal measurement and calibration. Time base jitter is caused by the fact that the actual sampling time is not equal to the ideal sampling time. In the actual sampling process, the sampling interval is often not exactly equal to the ideal sampling time, but there is a time deviation from the ideal value. In precision measurement, when the high-speed oscilloscope samples the signal, the measurement results more or less have time base jitter, which seriously affects the test results. For example, an important step in Nose-to-Nose calibration technology is the removal of time base jitter. Contents of the invention [0003] The invention provi...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
Inventor 朱江淼高原
Owner BEIJING UNIV OF TECH
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