Built-in self-test system based on on-chip system or system-in-package

Abstract

The invention relates to a built-in self-test system based on an on-chip system or system-in-package. The built-in self-test system comprises a waveform generator, a waveform controller, a digital-to-analog converter, a to-be-tested analog-to-digital converter and a processor, wherein the waveform generator is used for generating a voltage excitation signal for testing; the waveform controller is connected with the waveform generator, and is used for receiving and processing the voltage excitation signal for testing, and outputting a digital quantity excitation signal with a controllable waveform parameter; the digital-to-analog converter is used for receiving the digital quantity excitation signal and converting the digital quantity excitation signal into an analog quantity excitation signal; the to-be-tested analog-to-digital converter is used for converting the analog quantity excitation signal into a digit sequence and transferring the digit sequence to the waveform controller; and the processor is connected with the waveform controller, and is used for inputting to the waveform controller an instruction of controlling the waveform parameter of the digital quantity excitation signal, and collecting the digit sequence through the waveform and converting the digit sequence into histogram data and saving the data. By using the built-in self-test system based on the on-chip system or system-in-package, in-chip integrated devices are reduced, the occupation of chip space is reduced, and the reliability of the system is improved.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a built-in self-testing system based on system-on-chip or system-in-package. Background technique [0002] Built-in self-test is a test done by built-in hardware functions. The characteristic of built-in self-test is that the test signal is generated by the integrated circuit itself, and it depends on the logic of the integrated circuit to judge whether the test response is correct. Such as figure 1 As shown, the components of the built-in self-test mainly include TPG (Test Pattern Generation, test vector generator), controller and ORA (Output Response Analyzer, output response analyzer). TPG is mainly responsible for the generation of test signals, and ORA is mainly used to collect and analyze the output response of the circuit under test under the action of the test signal generated by TPG. The main role of the controller is to monitor the entire test process, inclu...

AI Technical Summary

Problems solved by technology

[0005] In view of this, it is necessary to provide a built-in self-test system based on a system-on-chip or a system-in-package to solve the problem that there are many built-in self-test analog components.

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