Circuit used for indicating process corner and extreme temperature

Abstract

The present invention discloses a circuit used for indicating process corner and extreme temperature. It mainly comprises a proportional to absolute temperature (PTAT) current source, a negative to absolute temperature (NTAT) current source, a constant to absolute temperature (CTAT) current source, a corner detector, a poly detector, an extreme temperature detector. The circuit can save more power consumption without trade-off. In debug phase, the suspect sample can read out which state is and can run simulation check quickly to identify the real problem. In production phase, process indicator can easy read out at CP station. In the mean time, the large quantity of data can be easy collected and analyzed.

Description

technical field [0001] The invention relates to a detection circuit, in particular to a circuit capable of detecting process boundary angle and extreme temperature. Background technique [0002] Circuits built on integrated circuit (IC) chips or boards are called integrated circuits. For example, integrated circuits contain transistors and resistors. Integrated circuits are manufactured using a large number of integrated circuit manufacturing processes, such as CMOS transistor manufacturing processes. Integrated circuits can be characterized by many circuit parameters, such as sheet resistance, transistor critical voltage, and transistor transconductance parameters. [0003] A major challenge in IC design is controlling circuit parameters such as delay, semiconductor process considerations, supply voltage and temperature. All of the above parameters and variables generally exhibit complex relationships with each other. One of the most important in integrated circuits is ...

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Problems solved by technology

However, using too many complex structures costs more chip area and calibration time

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