Method and device for testing radiation of laser or light emitting diode (LED) in electric toy

A technology of light-emitting diodes and testing methods, which is applied in the direction of optical radiation measurement, optical instrument testing, and measuring devices, and can solve problems such as inaccurate and error radiation values ​​of lasers or light-emitting diodes

Inactive Publication Date: 2013-01-02
SHENZHEN ENTRY EXITINSPECTION & QUARANTINE BUREAU OF THE PEOPLES REPUBLIC OF CHINA
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Problems solved by technology

[0003] At present, the approximate measurement method is used for the radiation test of lasers or light-emitting diodes in electric toys. The measured thermal hazard radiation distance is an a

Method used

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  • Method and device for testing radiation of laser or light emitting diode (LED) in electric toy
  • Method and device for testing radiation of laser or light emitting diode (LED) in electric toy
  • Method and device for testing radiation of laser or light emitting diode (LED) in electric toy

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Embodiment Construction

[0042] 1. Elaboration of several basic concepts in the present invention;

[0043] 1.1 Magnification of imaging device

[0044] The magnification of the imaging device means that after the apparent light source of the laser or light-emitting diode is enlarged by the lens of the imaging device, the size of the image seen by the human eye when the apparent light source of the laser or light-emitting diode is clearly imaged is perpendicular to the apparent light source. ratio of size.

[0045] 1.2 Opposite angle of apparent light source α

[0046] Apparent sub-angle of light source α The optical path principle see Figure 5 ,according to Figure 5 And related geometric knowledge can be obtained:

[0047] d x , d y is the actual size of the apparent light source in the vertical direction, the rectangular apparent light source d x and d y equal to the length and width of the rectangle, and the apparent source of the circle d x and d y equal to the diamete...

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Abstract

The invention relates to a method and a device for testing radiation of a laser or a light emitting diode (LED) in an electric toy. The device comprises a support, a first test sample platform and a first optical power meter, wherein a rotary plane is connected with a shaft Z of the support through a rotary shaft, the rotary plane is provided with a first lens and a first aperture diaphragm of a first imaging device, which stay in a same plane, the first aperture diaphragm is closely attached to a first optical power meter probe, the center of the first aperture diaphragm is aligned to the center of the first optical power meter probe, one side of the support is provided with a parallel translation device, and the first test sample platform is arranged on the parallel translation device; and the first optical power meter is electrically connected with the first optical power meter probe. The device for testing the radiation of the laser or the LED in the electric toy is simple to operate and capable of precisely measuring a thermal hazard radiation distance so as to precisely obtain the optical radiation of the laser or the LED in the electric toy.

Description

technical field [0001] The invention relates to a method and device for testing the radiation of a laser or a light-emitting diode in an electric toy. Background technique [0002] With the development of the toy manufacturing industry, various electric toys have been invented and manufactured. While electric toys bring happiness to people, they also bring harm. Because the radiation of lasers or light-emitting diodes in electric toys tends to contain high-energy light radiation, too much light energy is transmitted to biological tissues, and the resulting photothermal damage can lead to organ damage. Excessive light radiation mainly causes damage to human eyes and skin. Short-term exposure will cause corneal or retinal burns to the eyes, causing erythema on the skin; frequent exposure to energy exceeding a certain limit will cause keratitis or lens opacity and retinal damage. Damage; strong exposure to high-energy light radiation may cause skin burns, and certain wavel...

Claims

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Application Information

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IPC IPC(8): G01M11/00G01J1/00
Inventor 徐晓光徐勤张栋钟勇尹丽娟杨丽丹杨欢
Owner SHENZHEN ENTRY EXITINSPECTION & QUARANTINE BUREAU OF THE PEOPLES REPUBLIC OF CHINA
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