Controllable contact type scanning measurement head with constant measurement force

A scanning probe, contact technology, used in measuring/indicating equipment, metal processing mechanical parts, metal processing equipment, etc., can solve problems such as surface damage and processing accuracy, achieve good performance, improve measurement accuracy, and avoid processing. The effect of precision

Inactive Publication Date: 2013-01-16
KUNSHAN HAOKUN MACHINERY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] Aiming at the deficiencies in the prior art, the purpose of the present invention is to provide a contact scanning probe with constant and controllable measuring force, which further improves the measurement accuracy of the contact scanning and better avoids the failure caused by the measurement process. The surface contact of the measured object leads to problems such as surface damage of the measured object; in addition, it avoids the impact on the machining accuracy caused by the secondary clamping error of the workpiece, and improves the processing and measurement efficiency

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  • Controllable contact type scanning measurement head with constant measurement force
  • Controllable contact type scanning measurement head with constant measurement force
  • Controllable contact type scanning measurement head with constant measurement force

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Embodiment Construction

[0023] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.

[0024] refer to Figure 1-4 , the specific embodiment adopts the following technical scheme: it includes a measuring head 2, a probe 1 arranged on the measuring head 2, a collet handle 3, a data cable 4 and a gas pipe joint 5, and the collet handle 3 and the probe 1. Set the top and bottom of the measuring head 2 respectively, the data cable 4 and the gas pipe connector 5 are arranged on the outside of the measuring head 2, and it is characterized in that the inner bottom of the measuring head 2 is provided with an air guide rail 9 and a The hollow tube 11 on the air guide rail, the two ends of the hollow tube 11 are respectively fixed with the laser ruler 14 and the probe 1 through the upper connector 81 and the lower connector 82, and a standard...

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Abstract

The invention discloses a controllable contact type scanning measurement head with constant measurement force, and relates to the field of precision measurement equipment. A clamping head shank (3) and a probe (1) are respectively arranged on the top and at the bottom of the measurement head (2); a data cable (4) and an air pipe joint (5) are arranged on the outer side of the measurement head (2); a base plate (17) is fixed at the bottom inside the measurement head (2) through a lower fixing plate (6); an air guide rail mounting plate (10) is arranged in the middle of the upper side of the base plate (17); two air guide rails (9) are fixed on the air guide rail mounting plate (10) and the base plate (17); hollow pipes (11) are inserted into the air guide rails (9); and a laser scale (14) and the probe (1) are respectively fixed at two ends of the hollow pipes (11) through an upper connection piece (81) and a lower connection piece (82). By the controllable contact type scanning measurement head, the contact type scanning measurement precision is improved, and the processing and measurement efficiency is improved.

Description

technical field [0001] The invention relates to the field of precision measuring equipment, and relates to a contact scanning measuring head with constant and controllable measuring force. Background technique [0002] Precision probes used in shape tolerance and surface roughness measurement equipment such as ultra-precision parts, precision molds, and optical mold cores generally fall into two categories: non-contact scanning probes and contact scanning probes. Non-contact scanning probes Due to the method of optical scanning to obtain the surface shape and position error of the measured workpiece, it is widely used, but because it must have an expensive optical system, its structure becomes complicated, and the current machine vision technology can identify The smallest size makes it difficult for this type of probe to have nanometer-level measurement accuracy, which cannot fully meet the application requirements. The contact scanning probe does not need to be equipped w...

Claims

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Application Information

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IPC IPC(8): B23Q17/20
Inventor 亢建兵
Owner KUNSHAN HAOKUN MACHINERY
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