A reusable test stick and its application method
A technology of test rods and fixed parts, applied in the field of test rods, can solve problems such as waste, high test cost, and relatively uneven thickness, and achieve the effects of reducing uneven thickness, convenient operation, and reducing procurement costs
Inactive Publication Date: 2015-08-05
JIANGXI SAI WEI LDK SOLAR HI TECH CO LTD
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Problems solved by technology
This type of quartz rod is easy to corrode and deform, can only be used once or twice, and the test cost is high
In addition, the corroded and deformed section of this type of quartz rod is relatively short, and the remaining undeformed sections are long, resulting in waste
Another kind of domestic test rod is 1.8 meters, the thickness is relatively uneven, and the quartz rod with occasional air leakage is worth 340 RMB. There is no guarantee that the purchased quartz rods can be used for testing
Method used
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[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0022] see figure 1 , a reusable test rod 10 for measuring the growth rate or melting rate of an ingot, the test rod 10 includes a fixed part 1, a replacement part 2 and a connecting device 3. The connection device 3 connects one end of the fixed part 1 and one end of the substitute part 2, the other end of the fixed part 1 is used for connecting to the ingot furnace, and the other end of the substitute part 2 is used for immersing in the silicon liquid 4 to test t...
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Abstract
The invention discloses a reusable test rod, which is used for measuring the crystal growth speed or melting speed of cast ingots. The test rod comprises a fixing part, a connecting device and a replacing part, wherein the connecting device is connected with one end of the fixing part and one end of the replacing part; the other end of the fixing part is connected to a cast ingot furnace; and the other end of the replacing part is soaked in silicon liquid to test the crystal growth speed or the melting speed. The invention also discloses an application method for the reusable test rod. The test rod and the application method thereof are convenient to operate, the purchasing cost is reduced, and the probability of the influence on the quality of silicon ingots caused by air entering a furnace body in the testing process due to non-uniform thickness of the test rod is also reduced.
Description
technical field [0001] The invention relates to the field of measurement of ingot growth rate or melting rate, in particular to a reusable test rod and an application method thereof. Background technique [0002] Silicon crystal materials are widely used in photovoltaic solar energy, liquid crystal display and semiconductor fields. In the process of growing silicon crystals using polysilicon ingot technology, when a newly purchased polysilicon ingot furnace casts ingots for the first time, or when the thermal field is replaced, or the ingot process is modified, those skilled in the art will have no idea about the actual length of the polysilicon ingot furnace. The crystallization rate is not exact. In order to achieve a suitable crystal growth rate, the crystal growth rate needs to be monitored regularly as a basis for adjusting the process parameters of the polysilicon ingot furnace. On the other hand, with the development of ingot casting technology, most companies are c...
Claims
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IPC IPC(8): C30B29/06C30B28/06C30B11/00C30B35/00
Inventor 陈红荣胡动力鄢俊琦
Owner JIANGXI SAI WEI LDK SOLAR HI TECH CO LTD