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Double-layer data model-driven plant-level chemical process monitoring method

A chemical process and data model technology, applied in the direction of comprehensive factory control, comprehensive factory control, electrical program control, etc., can solve the problems affecting the performance of factory-level process monitoring and ignoring the relationship between sub-modules, so as to facilitate expansion and implementation, Effect of Improving Monitoring Performance

Inactive Publication Date: 2013-01-16
ZHEJIANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this type of method often ignores the relationship between sub-modules, and this relationship may affect the monitoring performance of the entire plant-level process

Method used

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  • Double-layer data model-driven plant-level chemical process monitoring method
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  • Double-layer data model-driven plant-level chemical process monitoring method

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Embodiment Construction

[0018] Aiming at the monitoring problem of the plant-level chemical process, the present invention first collects the process data by using a distributed control system, performs necessary preprocessing and normalization, and then divides the entire process data set into different sub-modules. For the data set corresponding to each sub-module, establish a principal component analysis model and establish the control limits of monitoring statistics. After obtaining the principal element information corresponding to each sub-module data set, it is recombined into a new data set, and then a single-class support vector machine is used to model it. When monitoring new process data, the data is also divided into different sub-modules, and the mean and standard deviation of the modeling data of each sub-module are used to normalize it. After obtaining the standard data, use each The principal component analysis model of the sub-module calculates the principal component information of t...

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Abstract

The invention discloses a double-layer data model-driven plant-level chemical process monitoring method. Relationships between sub-modules are modeled by constructing a double-layer data statistical analysis model on the basis of blocking modeling, so that a plant-level process is globally monitored. Compared with the conventional other plant-level process monitoring methods, the method has the advantages that each unit of the process can be monitored in each sub-module, relationship information between the sub-modules of the plant-level process can be effectively combined, and the whole plant-level process is globally monitored by utilizing a second-layer data model, so that the monitoring performance of the plant-level chemical process is greatly improved, and the industrial automation of the plant-level process can be favorably expanded and implemented.

Description

Technical field [0001] The invention belongs to the field of safety monitoring and quality control of the production process of the chemical industry, and particularly relates to a plant-level chemical process monitoring method driven by a two-layer data model. Background technique [0002] With the increasing production scale of modern industrial processes, a new type of factory-level process has attracted more and more attention. The modeling, monitoring and control of plant-level processes have also received extensive attention from academia and industry. A typical plant-level process usually includes multiple operating units, multiple process devices, and even multiple operating workshops. For such a complex large-scale chemical process, it will be very difficult to adopt traditional monitoring methods based on mechanism models. In contrast, due to the accumulation of a large amount of data in the process, data-based modeling and monitoring methods are more suitable for com...

Claims

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Application Information

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IPC IPC(8): G05B19/418
CPCY02P90/02
Inventor 葛志强宋执环
Owner ZHEJIANG UNIV
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