In-situ indentation/scratch testing device

A scratch test, in-situ technology, applied in the direction of testing material hardness, etc., can solve the problems of nano-indentation and scratch test device development and research are few, hindering development, etc., to achieve compact structure, high positioning accuracy, quality light effect

Inactive Publication Date: 2013-02-13
JILIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the lack of core technology in our country is only in its infancy, and there are very few developments and researches on nano-indentation and scratch testing devices.
The development of many fields has been severely restricted, hindering the development of our country in related fields

Method used

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  • In-situ indentation/scratch testing device
  • In-situ indentation/scratch testing device
  • In-situ indentation/scratch testing device

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Embodiment Construction

[0021] The detailed content of the present invention and its specific implementation will be further described below in conjunction with the accompanying drawings.

[0022] see figure 1 , the in-situ pressure / scratch testing device of the present invention includes a precision positioning platform in X and Y directions, a precision linear positioning platform in Z direction, a precision pressing drive unit, a load signal detection and a displacement signal detection unit, wherein the X, The precision positioning platform in the Y direction is fixed on the base 13 through the connecting plate II3, and the stage 5 is connected with the precision positioning platform in the X and Y directions through the piezoelectric stacks 17 and 14 in the X and Y directions. The piezoelectric stacks 17 and 14 in the X and Y directions on the precision positioning platform are directly driven to realize precise movement in the X and Y directions. The diamond indenter 6 is fixedly connected wit...

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Abstract

The invention relates to an in-situ indentation/scratch testing device and belongs to the field of mechatronical precision scientific instruments. The in-situ indentation/scratch testing device comprises an X and Y direction precision positioning platform, a Z direction precision linear positioning platform, a precision press-in driving unit and a load signal detection and displacement signal detection unit. The X and Y direction precision positioning platform is fixed to a base by a connection plate II. An objective table is connected to the X and Y direction precision positioning platform by an X and Y direction piezoelectric stack. The Z direction precision linear positioning platform is installed on the base. A stepping motor and a guide rail of the precision press-in driving unit are respectively fixed to the base. The load signal detection and displacement signal detection unit is fixed to the base. The in-situ indentation/scratch testing device has the advantages of small volume, compact structure, light weight, good rigidity and high positioning precision. The in-situ indentation/scratch testing device can carry out a mechanical property test of a three-dimensional test specimen having a millimeter-scale feature size, and realize a nanoscale displacement loading resolution ratio and a micron-scale load resolution ratio.

Description

technical field [0001] The invention relates to the field of electromechanical precision scientific instruments, in particular to an in-situ pressure / scratch test device integrating drive, loading and detection. Background technique [0002] In recent years, with the modernization, scale and industrialization of industry, and the development of high-tech and national defense technology, the requirements for the surface properties of various materials are getting higher and higher. In the 1980s, modern surface technology was hailed as one of the ten most promising technologies by the international scientific and technological circles. All countries in the world attached great importance to the research on the physical, chemical, and mechanical properties of the nano-scale surface layer of materials and their detection methods. At present, the thickness of the film has reached the level of micron or even nano-level, and the traditional testing methods for mechanical properties...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/40
Inventor 赵宏伟米杰黄虎邵明坤
Owner JILIN UNIV
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