Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Semiconductor package structure and manufacturing method thereof

A technology of packaging structure and manufacturing method, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device components, etc., can solve the problems of inability to stack chips, pollute the active surface of chips, and fail to apply CMOS chips, etc. The effect of reducing production cost and increasing structural reliability

Active Publication Date: 2013-03-06
CHIPMOS TECH INC
View PDF3 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the phenomenon of glue overflow during packaging, the encapsulation glue extends to part of the active surface of the chip and contaminates the active surface of the chip, so this method cannot be applied to CMOS chips
[0004] Furthermore, the above-mentioned method cannot package multiple semiconductor elements (such as chips) in the same package structure by vertical stacking.
Since it is known to increase the area design of the chip by encapsulating the chip with encapsulation gel, but the reconfiguration circuit layer is only located on the active surface of the chip and the bottom surface of the encapsulation compound, so it is impossible to stack the chips in the form of stacking

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor package structure and manufacturing method thereof
  • Semiconductor package structure and manufacturing method thereof
  • Semiconductor package structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] Figure 1A to Figure 1G It is a schematic cross-sectional view of a manufacturing method of a semiconductor package structure according to an embodiment of the present invention. Please refer to Figure 1A , The manufacturing method of the semiconductor package structure of this embodiment includes the following steps. First, a chip 110 is provided, wherein the chip 110 has an active surface 112 and a back surface 114 opposite to each other and a plurality of bonding pads 116 on the active surface 112 . Next, the chip 110 is disposed on a carrier board 10 , wherein the active surface 112 of the chip 110 faces the carrier board 10 .

[0051] Next, please refer to Figure 1B , forming a first encapsulant 120 on the carrier board 10 to cover the chip 110 and part of the carrier board 10 .

[0052] Afterwards, please also refer to Figure 1C and Figure 1D, provide a metal material layer 130', and coat a layer of photoresist (not shown) on a first surface 132' and a se...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method of manufacturing a semiconductor package structure is provided, comprising the steps that a chip is provided; an active surface of the chip is disposed on a carrier; a molding compound is formed on the carrier with a metal layer disposed thereon, the metal layer has an upper and lower surface, multiple cavities formed on the upper surface and multiple protrusions formed on the lower surface and corresponding to the cavities, the protrusions are embedded in the molding compound, the metal layer is patterned to form multiple pads on a portion of the molding compound, the carrier and the molding compound are separated, multiple through holes are formed on the molding compound exposing the protrusions; a redistribution layer is formed on the molding compound and the active surface of the chip; multiple solder balls are formed on the redistribution layer, and a portion of the solder balls are correspondingly disposed to the pads.

Description

technical field [0001] The present invention relates to a semiconductor element and its manufacturing method, and in particular to a semiconductor packaging structure and its manufacturing method. Background technique [0002] The purpose of chip packaging is to protect the bare chip, reduce the density of chip contacts and provide good heat dissipation for the chip. When the number of contacts of the chip continues to increase, while the area of ​​the chip is getting smaller and smaller, it is bound to be difficult to redistribute all the contacts of the chip on the surface of the chip in a matrix, even if the surface of the chip can accommodate all the contacts. , will also cause the distance between the contacts to be too small, which will affect the electrical reliability of the subsequent welding of the solder balls. [0003] Therefore, the known technology proposes that the chip can be packaged with encapsulant to increase the area of ​​the chip, wherein the active su...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/56H01L23/29
CPCH01L23/3185H01L21/78H01L25/0657H01L23/48H01L23/5389H01L24/19H01L2225/1035H01L2225/1058H01L2924/15311H01L2924/15331H01L21/568H01L25/105H01L2224/12105H01L2924/181H01L2924/12042H01L2924/00
Inventor 廖宗仁黄成棠彭美芳
Owner CHIPMOS TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products