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Method for processing leaves by positioning and observing in the microstructure of plant leaves

A technology of plant leaves and microstructures, which can be used in material analysis using measurement of secondary emissions, preparation of samples for testing, sampling devices, etc., and can solve problems such as inability to study

Active Publication Date: 2015-09-30
SHENYANG AGRI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] 3. Unable to study unfamiliar, complex, and similar structures in different organizational structures at multiple levels

Method used

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  • Method for processing leaves by positioning and observing in the microstructure of plant leaves
  • Method for processing leaves by positioning and observing in the microstructure of plant leaves
  • Method for processing leaves by positioning and observing in the microstructure of plant leaves

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Experimental program
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Effect test

Embodiment Construction

[0147] The specific method mainly includes the following eight parts: ①The pretreatment part of the transmission leaf sample, ②The part of making the overall cross-sectional structure diagram for positioning, ③The part of making the transverse slice, ④The vertical space and tissue structure positioning part of the transverse slice, ⑤Checking the direction of the transverse slice The precision and sample observation part, ⑥ the implementation part of the whole system space positioning assurance regulations, ⑦ the cross-sectional image and the orderly positioning level, the construction of the microscopic three-dimensional structure part, and the eighth scanning electron microscope secondary electron image inspection corresponding three-dimensional structure part.

[0148] The main instruments used in this study: Switzerland-made LKB-1800 ultramicrotome; Japan Hitachi S-450 scanning electron microscope; JEOL JEM-100CXⅡ transmission electron microscope.

[0149] 1. Pretreatment te...

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PUM

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Abstract

The invention relates to a method for observing in a plant blade microstructure in an oriented manner by treating a blade by utilizing a large-precise instrument-transmission electron microscope. The method is characterized in that a blade section structure chart correlated to a transverse slice is drawn by using a new process, the positioning of the transverse slice in a tissue structure and a spatial structure of the blade is realized, and the complete set of precise positioning structure chart of the blade with a complicated microstructure or the precise positioning structure chart of a certain specific part can be guaranteed and obtained by using a set of spatial positioning rules; and a microcosmic stereostructure can be established by combining the blade section structure with a transverse orderly positioning structure. The invention aims at providing a brand new sample treating, slicing, positioning and observing method utilizing the transmission electron microscope to observer the blade structure as the transverse slice is taken as a basis, and according to method, the operation is simple, the precise positioning research can be carried out on all the microstructures of the blade; and simultaneously, the true microcosmic stereostructure of the blade is detected by the orderly positioning structure.

Description

technical field [0001] The invention relates to a method for treating leaves by using a transmission electron microscope, a large-scale precision instrument, to conduct positioning research in the microcosmic and ultramicroscopic structures of plant leaves. Background technique [0002] Leaf is an important organ of plants. In plant research, the research on plant leaves occupies a considerable proportion. [0003] The use of transmission electron microscopy to study the micro- and ultra-microstructure of leaves has been going on for decades, but the research method has been stagnant in section direction slicing. Due to the messy information obtained by slicing in the section direction, little progress has been made in the study of leaf structure until 2008 "A method for processing leaves for the study of holographic structure of plant leaves" in 2011 adopted horizontal slices of leaves to obtain a comprehensive and systematic method of obtaining a large amount of leaf micro...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/28G01N1/06G01N1/36G01N23/22
Inventor 李天来陈伟之
Owner SHENYANG AGRI UNIV