Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Four-terminal electrical impedance tomography method based on two-terminal impedance measurement mode

An impedance measurement and tomography technology, applied in material impedance, diagnostic recording/measurement, medical science, etc., can solve the problem that the four-terminal mode cannot meet the application requirements, the influence, and the lack of four-terminal impedance measuring instruments, etc., to improve the contrast. and resolution, speed up imaging, and improve utilization

Active Publication Date: 2013-04-03
BEIHANG UNIV
View PDF3 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The main disadvantage of two-terminal impedance measurement is that it will be affected by contact impedance
[0006] In addition, in practical applications, it is often encountered that the four-terminal mode cannot meet the application requirements or there is no four-terminal impedance measuring instrument

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Four-terminal electrical impedance tomography method based on two-terminal impedance measurement mode
  • Four-terminal electrical impedance tomography method based on two-terminal impedance measurement mode
  • Four-terminal electrical impedance tomography method based on two-terminal impedance measurement mode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The implementation of a four-terminal electrical impedance tomography method based on the two-terminal impedance measurement mode of the present invention will be further described below in conjunction with the accompanying drawings, and the reconstructed image obtained in the experiment will be given and reconstructed with the two-terminal electrical impedance tomography Comparative Results.

[0032] Step 1, refer to image 3 , establishing a finite element analysis model of the electrical impedance tomography (EIT) sensor 11;

[0033]Step 2, refer to image 3 , according to the sensitivity theory proposed by Geselowitz and Lehr, combined with the finite element analysis model of the EIT sensor 11, calculate the four-terminal sensitivity matrix S of the EIT sensor 11 in any excitation mode such as adjacent, relative or diagonal;

[0034] Step three, refer to Figure 1-2 , the working mode of the relay double T-type switch module is as follows: by default, the relay ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a four-terminal electrical impedance tomography method based on a two-terminal impedance measurement mode, and belongs to the technical field of the electrical nondestructive testing. The method comprises the following steps of: establishing a finite element model of an electrical impedance tomography sensor, and calculating a four-terminal sensitivity matrix of adjacent excitation, relative excitation or diagonal excitation modes; measuring two-terminal impedance for an electrode of a relay dual-T-type multi-channel switch module gate sensor; converting the two-terminal impedance value into the four-terminal impedance value in a corresponding excitation mode; and resolving the electric conductivity difference distribution in a sensitive field, and reconstructing images. The four-terminal electrical impedance tomography method based on the two-terminal impedance measurement mode provided by the invention is suitable for a non-intrusive mode electrical impedance tomography technology, and in particular is suitable for the situation that the four-terminal impedance measurement method does not meet application requirements or does not have a four-terminal impedance measurement instrument. The four-terminal electrical impedance tomography method based on the two-terminal impedance measurement mode provided by the invention can effectively improve the contrast ratio and resolution ratio of the constructed images, and can accelerate the imaging speed.

Description

【Technical field】 [0001] The invention belongs to the technical field of electrical non-destructive testing, in particular to a four-terminal electrical impedance tomography method based on a two-terminal impedance measurement mode. 【Background technique】 [0002] Electrical Impedance Tomography (EIT), which has been developed in the past 30 years, has important application prospects in the fields of industry and medicine due to its technical advantages such as non-invasiveness, portability, low price, and fast response. . EIT technology essentially obtains the medium distribution information of the object field according to the conductivity distribution of the sensitive field. By applying excitation current at the boundary of the sensitive field, when the conductivity distribution in the field changes, the potential distribution in the field changes, so that the measured voltage on the field boundary changes, and the obtained electrical impedance information can be reconst...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N27/02A61B5/053
Inventor 曹章陈健军周海力徐立军蒋昌华
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com