Substrate processing device
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- KURASHIKI BOSEKI KK
- Publication Date
- 2013-06-12
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Abstract
Description
technical field
[0001] The present invention relates to a substrate processing apparatus for processing substrates such as semiconductor wafers, glass substrates for liquid crystal display devices, and glass substrates for photomasks (hereinafter, simply referred to as "substrates") using a processing liquid. A technique for controlling the concentration of the treatment liquid when the treatment is performed in the treatment liquid heated to a high temperature is useful. Background technique
[0002] Conventionally, as such a substrate processing apparatus, one using, for example, high-temperature phosphoric acid (H 3 PO 4 ) solution to etch the silicon nitride film (SiN) on the surface of the substrate.
[0003] For example, in a semiconductor wafer process, when a silicon nitride film is etched using a phosphoric acid solution, a silicon dioxide film (SiO 2 ). In this case, it is generally required that only the silicon nitride film is etched, and the silicon dioxide ...