Photoelectric module performance test device and test method in high temperature environment

Abstract

The invention discloses a test device and a test method for the performance of a photovoltaic module in the high-temperature environment. The device comprises a high-temperature oven and further comprises an external test board. An internal test board is mounted in the high-temperature oven and connected with the external test board, and an output end of the external test board is transmitted to a computer. According to the test device and the test method, the heating test is performed on the whole photovoltaic module directly, sample data of 5 key parameters of the photovoltaic module under the temperature change are acquired, and the sample data are calculated through an Arrhenius model, accordingly, the service life of the photovoltaic module under the normal condition is evaluated; and testing can be performed without stripping a light-emitting diode (LED), and scale applications of the test are facilitated; and accelerated factors corresponding to the optimum test temperature can obtain a maximum value. When the test is performed on the temperature, the test time is actually far shorter than time required by the test performed at the specified temperature, the test time is only about 5% of the prior test time, and the test time is greatly shortened.

Description

technical field

[0001] The invention relates to an experimental device in the field of accelerated life test, and specifically refers to a photoelectric module performance test device and a test method in a high-temperature environment. Background technique

[0002] The unified definition of the accelerated H life H test was first proposed by the Merrom Air Show Center in 1967. The accelerated life test is based on reasonable H engineering H and H statistical H assumptions, using statistical models related to H physical H failure laws A test method that converts information obtained in an accelerated environment beyond the normal stress level to obtain a reproducible numerical estimate of the characteristics of the product at the rated stress level. In short, the accelerated life test is a life test method that shortens the test period by increasing the test stress while keeping the failure mechanism unchanged. The accelerated life test adopts the accelerated stress level t...

Examples

Embodiment

[0061] like Figures 1 to 3As shown, the photoelectric module performance test device under the high temperature environment of the present invention, the photoelectric module performance test device under the high temperature environment, comprises a high temperature oven, an internal test board is installed in the high temperature oven, and an external test board, the internal test board and the external test board Connection, the output signal of the external test board is transmitted to the computer; the internal test board includes an SFP socket, the SDA, SCL, VCC three pins of the SFP socket are connected to the metal terminal, the SDA bus and the SCL bus are connected to the optical module to achieve reading communication, VCC Provide stable power. There are n SFP sockets, n is a natural number greater than 1, and the n SFP sockets are respectively connected to the I2C bus multiplexer and the analog multiplexer. The multiplexer adopts the ADG506AKR model, and the I2C b...

technical field

[0001] The invention relates to an experimental device in the field of accelerated life test, and specifically refers to a photoelectric module performance test device and a test method in a high-temperature environment. Background technique

[0002] The unified definition of the accelerated H life H test was first proposed by the Merrom Air Show Center in 1967. The accelerated life test is based on reasonable H engineering H and H statistical H assumptions, using statistical models related to H physical H failure laws A test method that converts information obtained in an accelerated environment beyond the normal stress level to obtain a reproducible numerical estimate of the characteristics of the product at the rated stress level. In short, the accelerated life test is a life test method that shortens the test period by increasing the test stress while keeping the failure mechanism unchanged. The accelerated life test adopts the accelerated stress level t...

Examples

Embodiment

[0061] like Figures 1 to 3As shown, the photoelectric module performance test device under the high temperature environment of the present invention, the photoelectric module performance test device under the high temperature environment, comprises a high temperature oven, an internal test board is installed in the high temperature oven, and an external test board, the internal test board and the external test board Connection, the output signal of the external test board is transmitted to the computer; the internal test board includes an SFP socket, the SDA, SCL, VCC three pins of the SFP socket are connected to the metal terminal, the SDA bus and the SCL bus are connected to the optical module to achieve reading communication, VCC Provide stable power. There are n SFP sockets, n is a natural number greater than 1, and the n SFP sockets are respectively connected to the I2C bus multiplexer and the analog multiplexer. The multiplexer adopts the ADG506AKR model, and the I2C b...

Images