Photoelectric module performance test device and test method in high temperature environment

Abstract

The invention discloses a test device and a test method for the performance of a photovoltaic module in the high-temperature environment. The device comprises a high-temperature oven and further comprises an external test board. An internal test board is mounted in the high-temperature oven and connected with the external test board, and an output end of the external test board is transmitted to a computer. According to the test device and the test method, the heating test is performed on the whole photovoltaic module directly, sample data of 5 key parameters of the photovoltaic module under the temperature change are acquired, and the sample data are calculated through an Arrhenius model, accordingly, the service life of the photovoltaic module under the normal condition is evaluated; and testing can be performed without stripping a light-emitting diode (LED), and scale applications of the test are facilitated; and accelerated factors corresponding to the optimum test temperature can obtain a maximum value. When the test is performed on the temperature, the test time is actually far shorter than time required by the test performed at the specified temperature, the test time is only about 5% of the prior test time, and the test time is greatly shortened.

Description

technical field [0001] The invention relates to an experimental device in the field of accelerated life test, and specifically refers to a photoelectric module performance test device and a test method in a high-temperature environment. Background technique [0002] The unified definition of the accelerated H life H test was first proposed by the Merrom Air Show Center in 1967. The accelerated life test is based on reasonable H engineering H and H statistical H assumptions, using statistical models related to H physical H failure laws A test method that converts information obtained in an accelerated environment beyond the normal stress level to obtain a reproducible numerical estimate of the characteristics of the product at the rated stress level. In short, the accelerated life test is a life test method that shortens the test period by increasing the test stress while keeping the failure mechanism unchanged. The accelerated life test adopts the accelerated stress level t...

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Problems solved by technology

[0004] The purpose of the present invention is to provide a photoelectric module performance testing device and testing method in a high temperature environment, to solve the current distortion problem of replacing the reliability of the entire photoelectric module with the reliability of the LED, and to achieve the purpose of testing the entire photoelectric module

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