Method for rapidly calibrating and correcting spectra through Fourier transform infrared imaging spectrograph
An infrared imaging spectrometer and Fourier transform technology, applied in the field of infrared imaging spectrometer, can solve the problems of lack of off-axis pixel spectral calibration and correction technology, and achieve the effect of improving speed and estimation accuracy
Active Publication Date: 2015-07-08
HUBEI JIUZHIYANG INFRARED SYST CO LTD
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The Chinese invention patent application "Shortwave Infrared Laboratory Spectral Calibration and Correction Method for Hyperspectral Imager" with the authorized announcement number CN102538966A discloses a method for spectral calibration and correction. drift correction, but this method is not suitable for Fourier transform infrared imaging spectrometer
At the same time, the current research on off-axis pixel spectral calibration correction technology is relatively lacking.
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[0036] Below in conjunction with accompanying drawing, specific embodiment of the present invention is described in further detail:
[0037] The method of the present invention first accurately estimates the spectral drift of each pixel position of the infrared detector array of the spectrometer, and determines the central wave number drift of each band of each pixel:
[0038] like figure 1 As shown, a rectangle is used to represent the pixel of the infrared detector array, where dx=2A and dy=2B represent the length and width of the pixel respectively, (x c ,y c ) represents the coordinates of the center point of the pixel. from figure 1 The angle Φ truncated by the pixel can be obtained, and the radiation area is divided into five parts by four circles with a critical radius, such as figure 2 shown. From the figure, the radii of the four circles can be obtained as follows:
[0039] r min = ( ...
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A method for rapidly calibrating and correcting spectra through a Fourier transform infrared imaging spectrograph includes steps of firstly, accurately estimating a spectrum drift distance of a position where each pixel is arrayed by an infrared detector of the spectrograph, and determining a central wave number drift distance of each wave band of each pixel; secondly, calibrating and correcting each wave band of each pixel according to the central wave number drift distance, determined the first step, of each wave band of each pixel. Furthermore, model estimation and reference light estimation are combined when the spectrum drift distances are accurately estimated, and an interference pattern after being corrected when the spectrum is corrected is expressed as so that rapid Fourier conversion can be used for conducting calculation. According to the method for rapidly calibrating and correcting the spectra through the Fourier transform infrared imaging spectrograph, rapid spectrum calibration and correction can be conducted on each wave band of each pixel of the interference pattern, and the problem that line drift exists in off-axis pixels of a hyper spectral image caused by an optical path difference between the off-axis pixels and on-axis pixels is solved.
Description
technical field [0001] The invention relates to an infrared imaging spectrometer, in particular to a fast calibration and correction method for a Fourier transform infrared imaging spectrometer. Background technique [0002] Infrared imaging spectrometer has the advantages of map analysis, comprehensive detection ability and high sensitivity, so it has important applications in the fields of environmental monitoring, public safety, non-destructive testing, target radiation characteristics research, etc., especially in the fields of gas analysis and marine environmental monitoring. important value. At present, various types of infrared imaging spectrometers have become standard tools in the fields of environmental monitoring, gas analysis and target radiation characteristics research, and are of great significance to the implementation of national marine strategy, environmental protection strategy and green development of social economy. [0003] According to the fine spectr...
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IPC IPC(8): G01J3/28
Inventor 岳松赵坤张智杰雷波王晨晟
Owner HUBEI JIUZHIYANG INFRARED SYST CO LTD