Particle fluence rate selection method for large scale integrated circuit accelerator single particle test

Abstract

The invention provides a particle fluence rate selection method for a large scale integrated circuit accelerator single particle test. The particle fluence rate selection method for the large scale integrated circuit accelerator single particle test including the following steps: S1, judging whether the DICE design is adopted inside a large scale integrated circuit or not, S2, conducting high-fluence rate irradiation on the large scale integrated circuit according to the ASTMF 1192 standard code if the DICE design is adopted, S3, judging whether the TMR is adopted in the large scale integrated circuit or not according to the procedures used by the large scale integrated circuit if the DICE design is not adopted, S4, conducting low-fluence rate irradiation on the large scale integrated circuit if the TMR is adopted, S5, judging whether the EDAC is adopted in the large scale integrated circuit or not according to the procedures used by the large scale integrated circuit if the TMF is not adopted, S6, conducting the low-fluence rate irradiation on the large scale integrated circuit if the EDAC is adopted, and S7, conducting the high-fluence rate irradiation on the large scale integrated circuit if the EDAC is not adopted. Compared with the prior art that only the high-fluence rate irradiation is used, the particle fluence rate selection method for the large scale integrated circuit accelerator single particle test improves irradiation evaluation accuracy.

Description

technical field [0001] The invention relates to a particle fluence rate selection method in a single particle test of a large-scale integrated circuit accelerator, and belongs to the technical field of radiation tests. Background technique [0002] One of the important work content of large-scale integrated circuit anti-radiation hardening guarantee is the single event flip test. Existing single particle test methods, such as QJ10005 "Guidelines for Heavy Ion Single Event Testing of Aerospace Devices" and ASTM F1192 "Guidelines for Measuring Single Event Phenomena of Semiconductor Devices Caused by Heavy Ions", stipulate that ground single particle tests should be carried out at high fluence rates, and note that Quantity rate is generally in the range of 1 to 10 4 Particles / cm 2 .s, the fluence rate of space radiation particles is generally lower than 1×10 -3 Particles / cm 2 .s, much lower than the test fluence rate. With the development of microelectronics design and ma...

AI Technical Summary

Problems solved by technology

[0003] The technical problem of the present invention is: to overcome the deficiencies of the prior art, to provide a particle fluence rate selection method in the large-scale integrated circuit accelerator single particle test, to solve the problem of using a high fluence rate single particle irradiation test to evaluate large-scale circuits Issue with inaccurate single event flipping

Images