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Electron beam section measuring system of high-current electron beam analysis meter

A measurement system and electron injection technology, applied in radiation measurement, measurement device, X/γ/cosmic radiation measurement, etc., can solve the problem of low efficiency, poor performance, and inability to measure the transmission characteristics of electromagnetic focusing electron injection electron injection optics Performance and other issues, to save time and simplify the measurement process

Inactive Publication Date: 2013-10-30
INST OF ELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

[0014] The technical problem to be solved by the present invention is to provide an electronic beam cross-section measurement system of a high-current electron beam analyzer, which aims to solve the traditional problems of poor performance and low efficiency of the electronic beam cross-section measurement system of a high-current electron beam analyzer, and Unable to measure electron beam transport characteristics of electromagnetic focusing and electron optical properties of electron beam with significant relativistic effect at 20-100kV

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  • Electron beam section measuring system of high-current electron beam analysis meter
  • Electron beam section measuring system of high-current electron beam analysis meter
  • Electron beam section measuring system of high-current electron beam analysis meter

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Embodiment Construction

[0036] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0037] Figure 4 It is a schematic structural diagram of the electron beam cross-section measurement system of the high-current electron beam analyzer of the present invention, which is the main view; Figure 5 yes Figure 4 top view of Figure 6 It is a structural schematic diagram of the X-ray bremsstrahlung YAG detector of the present invention; Figure 7 It is an enlarged schematic diagram of the YAG support and movement mechanism of the present invention; Figure 8 It is an enlarged schematic view of the YAG main rod movement positioning mechanism and the optical observation camera part 501 of the present invention.

[0038] Such as Figure 4 , 5 As shown, the electron beam cross-section measurement system used...

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Abstract

The invention discloses an electron beam section measuring system of a high-current electron beam analysis meter. The electron beam section measuring system of the high-current electron beam analysis meter comprises a high-vacuum cavity body (101). A front port (101) is formed in the high-vacuum cavity body (101) and used for being connected with an external device. The high-vacuum cavity body (101) is installed in a transversely horizontal mode. The electron beam section measuring system further comprises a YAG supporting cylinder supporting and moving mechanism (301) and a YAG crystal detector (201). The YAG supporting cylinder supporting and moving mechanism (301) is located in the high-vacuum cavity body (101) and is used for supporting the YAG crystal detector (201); the YAG crystal detector (201) is used for detecting the spatial density distribution of an electron beam. The electron beam section measuring system can be connected with the transverse high-current electron beam analysis meter to measure the transmission character of the electron beam in the whole process under the condition of electromagnetic focusing and can also measure the optical performance of 20kV-100kV high-current electron beams.

Description

technical field [0001] The invention relates to the technical field of microwave electronic devices, in particular to an electron beam section measuring system of a high-current electron beam analyzer. Background technique [0002] figure 1 It is a schematic diagram of the structure of the traditional small electron beam section measurement system used in the microwave vacuum device high-current electron beam analyzer. The system utilizes a vertical high-current electron beam to directly bombard the fluorescent screen for detection. figure 2 is a schematic diagram of the fluorescent screen of the measurement system. [0003] Such as figure 1 and figure 2 As shown, the measurement system is placed vertically, and the high-current electron beam emits vertically upwards and directly hits the fluorescent screen. The fluorescent screen includes a glass sheet, a molybdenum mesh, a fluorescent screen bracket, and a tie rod. Move the fluorescent screen through the lever. [...

Claims

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Application Information

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IPC IPC(8): G01T1/29
Inventor 李庆生吴迅雷阮存军李崇山李彦峰
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
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