Control method and system for Q-time interval products

A control method and control system technology, which is applied in the field of semiconductor manufacturing, can solve problems such as misjudgment, personnel negligence, poor communication, etc., and achieve the effect of reducing the amount of calculation and hardware requirements and ensuring quality

Active Publication Date: 2013-11-20
SHANGHAI HUALI MICROELECTRONICS CORP
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Problems solved by technology

[0004] However, the current industry generally uses front-line operators to control and communicate with upper and lower process operators based on experience. In this way, it is inevitable that there will be risks such as personnel negligence, poor communication, or misjudgment.

Method used

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  • Control method and system for Q-time interval products
  • Control method and system for Q-time interval products
  • Control method and system for Q-time interval products

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Embodiment Construction

[0037] The implementation of the present invention is described below through specific examples and in conjunction with the accompanying drawings, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0038] figure 1 It is a flow chart of the steps of a method for controlling products in the Q-time interval of the present invention. Such as figure 1 Shown, the control method of product in a kind of Q-time interval of the present invention of the present invention, comprises the steps:

[0039] Step 101 , obtain various parameters of the current Q-time zone manufacturing process, such a...

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Abstract

The invention discloses a control method and system for Q-time interval products. The method comprises the following steps: acquiring the parameters of the current Q-time interval processing procedure; calculating the weights of all steps in the current Q-time interval by a weight calculation formula according to the acquired parameters; calculating the loadings of the steps in the current Q-time interval according to the acquired weights; judging whether the number of on-line products in each step in the current Q-time interval is greater than the loading of the step; correspondingly processing the procedures in the current Q-time interval according to judgment results. According to the method, Q-time is averagely allocated to the steps according to the WPH (wafer per hour) weights of the steps so as to obtain the maximum WIP (Work In Process) quantity each step in the current interval can bear under the current WPH capability, so that risks caused by human judgment are avoided and the quality of products is ensured.

Description

technical field [0001] The present invention relates to the field of semiconductor manufacturing, in particular to a method and system for controlling products in a Q-time (allowable time) interval. Background technique [0002] In the manufacturing execution system (MES, Manufacture Execution System) widely used in large-scale semiconductor manufacturing foundries, it is often necessary to produce a wide variety of chips at the same time, and the processing technology of different chips is different, and the processing time period is different , and delivery dates vary. Under such complex production conditions, it is extremely important to rationally arrange the production capacity of each machine in the production line in real time. How to give full play to the production capacity of each machine in the existing production line, especially to increase the production capacity of the machines at key stations, so as to obtain reasonable and accurate dispatch The key to wheth...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q50/04
CPCY02P90/30
Inventor 冯亮
Owner SHANGHAI HUALI MICROELECTRONICS CORP
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