Unlock instant, AI-driven research and patent intelligence for your innovation.

Three-dimensional image measurement method based on line structured light

A line-structured light and three-dimensional image technology, applied to measuring devices, optical devices, instruments, etc., can solve the problems of inability to detect three-dimensional features, and achieve the effect of simple steps

Inactive Publication Date: 2016-01-20
解则晓
View PDF4 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method can only detect edge features in the same plane, and cannot detect three-dimensional features.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three-dimensional image measurement method based on line structured light
  • Three-dimensional image measurement method based on line structured light
  • Three-dimensional image measurement method based on line structured light

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The present invention will be further described below in conjunction with the accompanying drawings.

[0032] The method of the present invention is accomplished by a three-dimensional image measuring instrument based on line structured light. The three-dimensional image measuring instrument based on line structured light includes a line structured light projector 3 and a camera 1, wherein the line structured light projector 3 and the camera 1 are fixed on the same horizontal base and packaged together with the horizontal base inside the enclosure. The angle between the projection direction of the line-structured light projector 3 and the optical axis direction of the camera 1 is between 30° and 35°, and the distance from the light exit hole of the line-structured light projector 3 to the center of the image plane of the camera is between 90mm and 100mm . In order to realize the image measurement function, an annular LED light source 4 made of red LEDs is installed at...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a three-dimensional image measuring method based on line-structured light. The method can fast acquire three-dimensional data on the surface of an object based on the principle of the line-structured light, and can simultaneously acquire the precise edge contour data of a space object. Meanwhile, the method is simple in procedure, and in the respect of hardware, only an annular LED light source needs to be added to an existing three-dimensional image measurement instrument to achieve the method.

Description

technical field [0001] The invention relates to a three-dimensional image measurement method based on line structured light. Background technique [0002] In the prior art, the line structured light probe has been widely used in the fields of reverse engineering and quality control. Compared with the traditional three-coordinate measuring machine contact measurement, the line structured light probe greatly improves the measurement speed. This type of probe is usually composed of a laser transmitter and one or two charge-coupled device (ChargeCoupledDevice, referred to as CCD) cameras. Among them, the laser emitter emits a laser line and projects it onto the surface of the object; the CCD camera can receive the diffuse reflection light on the measured object. By calibrating the system, the pixel coordinates on the image plane of the CCD camera can be transformed into two-dimensional coordinates in the light plane. The three-dimensional scanning measurement of the object ca...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
Inventor 解则晓
Owner 解则晓