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Three-dimensional image measuring method based on line-structured light

A line-structured light and three-dimensional image technology, applied to measuring devices, optical devices, instruments, etc., can solve the problems of inability to detect three-dimensional features, and achieve the effect of simple steps

Inactive Publication Date: 2013-12-11
解则晓
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this method can only detect edge features in the same plane, and cannot detect three-dimensional features.

Method used

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  • Three-dimensional image measuring method based on line-structured light
  • Three-dimensional image measuring method based on line-structured light
  • Three-dimensional image measuring method based on line-structured light

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Embodiment Construction

[0031] The present invention will be further described below in conjunction with the drawings.

[0032] The method of the present invention is completed by a three-dimensional image measuring instrument based on line structured light. The three-dimensional image measuring instrument based on line structured light includes a line structured light projector 3 and a camera 1, wherein the line structured light projector 3 and the camera 1 are fixed on the same horizontal base and packaged together with the horizontal base In the case. The angle between the projection direction of the line structured light projector 3 and the optical axis direction of the camera 1 is between 30° and 35°, and the distance between the light exit hole of the line structured light projector 3 and the center of the camera image plane is between 90 mm and 100 mm . In order to realize the image measurement function, a ring LED light source 4 made of red LED is installed at the front end of the camera lens....

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Abstract

The invention relates to a three-dimensional image measuring method based on line-structured light. The method can fast acquire three-dimensional data on the surface of an object based on the principle of the line-structured light, and can simultaneously acquire the precise edge contour data of a space object. Meanwhile, the method is simple in procedure, and in the respect of hardware, only an annular LED light source needs to be added to an existing three-dimensional image measurement instrument to achieve the method.

Description

Technical field [0001] The invention relates to a three-dimensional image measurement method based on line structured light. Background technique [0002] In the prior art, the linear structured optical probe has been widely used in the field of reverse engineering and quality control. Compared with the traditional three-coordinate measuring machine contact measurement, the line structure optical probe greatly improves the measurement speed. This type of probe is usually composed of a laser transmitter and one or two Charge Coupled Device (CCD) cameras. Among them, the laser transmitter emits a laser line and projects it onto the surface of the object; the CCD camera can receive the diffusely reflected light on the measured object. By calibrating the system, the pixel coordinates on the image plane of the CCD camera can be converted into two-dimensional coordinates in the light plane. The three-dimensional scanning measurement of the object can be realized by moving the object...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 解则晓
Owner 解则晓