FPGA configuration information flip test platform and test method based on dynamic reconfiguration

Abstract

The invention discloses an FPGA (Field Programmable Gate Array) configuration information turnover testing platform based on dynamic reconfiguration and a testing method. The FPGA configuration information turnover testing platform comprises an upper computer control module, a TCP / IP (Transmission Control Protocol / Internet Protocol) communication module, a configuration read-write module, a to-be-tested module, a data collection module and an upper computer data analysis module, wherein the upper computer control module is used for generating a parameter required by testing, and transferring the parameter to the configuration read-write module through the TCP / IP communication module; the configuration read-write module is used for realizing the read-write and real-time turnover of configuration information through an interior collocation access port (ICAP); the to-be-tested module is provided by a user as required; the data collection module is used for generating an excitation signal required by the to-be-tested module, and sending an output result of the to-be-tested module, which is obtained after the configuration information is overturned, to the upper computer data analysis module; the upper computer data analysis module is used for counting and analyzing a tested result, and judging whether the function of the to-be-tested module can be realized correctly. The FPGA configuration information turnover testing platform has the advantages of low FPGA resource consumption, flexible to-be-tested system and high interface processing speed, and can be used for a reliability test of a satellite-borne FPGA system.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a platform for flipping test of FPGA configuration information, which can be applied to the reliability testing of space-borne FPGA systems. Background technique [0002] FPGA (Field Programmable Gate Array) has been widely used in the space field because of its excellent characteristics of flexible use and reprogrammable programming. However, due to the high-energy particle radiation in the space environment, it will cause single event effects in the FPGA, especially the flipping of single events, which will cause changes in the configuration information of the FPGA, resulting in circuit function errors, and the normal operation of the overall system cannot be guaranteed. In order to ensure the reliability of spaceborne FPGA system, it is necessary to carry out single event flip test. [0003] At present, in China, only specialized institutions can carry out the sin...

AI Technical Summary

Problems solved by technology

At this stage, the relevant technologies of my country's simulated single-event flipping test platform and testing methods are still in their infancy, such as the invention patent (CN200910043423.0) "Single-event flipping in field programmable logic gate array" applied by the National Defense Science and Technology University of the Chinese People's Liberation Army. Detection method and device", this patent application adopts NVRAM interface for configuration frame reading and readback control, which has the problems of large consumption of FPGA resources, inflexible adjustment of the system to be tested, and slow interface processing speed

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