Novel system for detecting transmittance and reflectivity of lens of optical system

An optical system and transmittance technology, which is applied in the field of new system devices for testing transmittance and reflectance, can solve problems such as unsuitable transmittance measurement, save operating time, improve signal-to-noise ratio, and improve work efficiency effect
CN103528797AActive Publication Date: 2014-01-22长春市艾必利务科技有限公司

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
长春市艾必利务科技有限公司
Publication Date
2014-01-22

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Abstract

The invention discloses a novel system for detecting transmittance and reflectivity of a lens of an optical system and belongs to the field of test devices of optical systems. The system comprises a monochromator and the like, wherein a white-light source emits white light which enters the monochromator; a collecting mirror couples light beams modulated through a rotating reflecting mirror and then guides the coupled light beams into optical fibers; the optical fibers are connected with the collecting mirror; detectors are connected with a lock-in amplifier through data lines; integrating spheres are connected with the optical fibers; an electric motor is connected with the rotating reflecting mirror; the lock-in amplifier is connected with a computer through a data line; and a moving type reflecting mirror is located outside the monochromator, receives monochromatic spectrums emitted by the monochromator and reflects the monochromatic spectrums to a spherical reflecting mirror. When the system is used for measuring the transmittance of tested objects, the dual integrating spheres are adopted, so that the reflectivity can be measured simultaneously. Besides, a test sample chamber is placed outside the integrating spheres, and the tested objects are placed inside the integrating spheres.
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Description

technical field

[0001] The invention belongs to the field of optical system testing devices, in particular to a new system device for testing transmittance and reflectivity. Background technique

[0002] In the prior art, spectrophotometers belonging to the same category as optical system testing devices have been developed both at home and abroad, and most of the products that are produced and put into the market on a large scale are imported from abroad. In contrast, domestic brands do not have enough strength to compete with imported products. To measure the transmittance and reflectance of thin films or optical components, commercial spectrophotometers are mainly used at present, such as Hitachi and Shimadzu in Japan, CAYR and P-E in the United States. The spectrophotometer produced by these companies is no problem for measuring the transmittance, and its photometric accuracy is ±0.1%T-±0.3%T, but the reflectance measurement is not easy, usually with a special expensive...

Claims

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