Novel system for detecting transmittance and reflectivity of lens of optical system
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- 长春市艾必利务科技有限公司
- Publication Date
- 2014-01-22
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Figure 1
Abstract
Description
technical field
[0001] The invention belongs to the field of optical system testing devices, in particular to a new system device for testing transmittance and reflectivity. Background technique
[0002] In the prior art, spectrophotometers belonging to the same category as optical system testing devices have been developed both at home and abroad, and most of the products that are produced and put into the market on a large scale are imported from abroad. In contrast, domestic brands do not have enough strength to compete with imported products. To measure the transmittance and reflectance of thin films or optical components, commercial spectrophotometers are mainly used at present, such as Hitachi and Shimadzu in Japan, CAYR and P-E in the United States. The spectrophotometer produced by these companies is no problem for measuring the transmittance, and its photometric accuracy is ±0.1%T-±0.3%T, but the reflectance measurement is not easy, usually with a special expensive...