A fault injection test system and test method suitable for embedded devices

Abstract

The invention discloses a fault injection testing system and a fault injection testing method applied to embedded equipment. A bus interface of an embedded system to be tested and the flexibility of a programmable logic device in the embedded system to be tested are used for realizing fault injection without changes in the hardware state of the embedded system to be tested and physical damage to the system to be tested, and high reliability is ensured; distance limits to fault injection test are eliminated, and the fault injection test can be implemented within a reliable transmission distance of a bus, so that the system and the method are flexibly and conveniently used; the fault injection testing system is used for testing the hardware and the software of the system to be tested in a hardware and software combination way to effectively realize fault injection in real time, and the fault-tolerance performance of the embedded system can be objectively evaluated through fault recovery system running information to further provide important bases for improving the error correcting and fault-tolerant capability of hardware designs and the software by embedded system designers to finally realize a high-reliability and high-security embedded system running environment.

Description

technical field [0001] The invention relates to a fault injection testing system and a testing method, in particular to a fault injection testing system and a testing method suitable for embedded devices, and belongs to the technical field of testing. Background technique [0002] The reliability requirements of various embedded electronic devices inside aerospace vehicles are extremely high, and they are also susceptible to interference from various environmental factors during operation, which brings more and more uncertain factors to the successful completion of flight missions. For example, the computer used on the satellite will face the environment of high-altitude particle radiation, and the single event effect caused by it will cause the software and hardware failure or failure of the computer; another example is the computer working in the electromagnetic warfare environment, which is subject to strong electromagnetic pulse interference. It can also cause errors in ...

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Problems solved by technology

[0009] At present, there are no comprehensive and complete public technical materials and patents for embedded systems, including ground fault injection equipment, embedded equipment to be tested, injection routes, etc.

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