Automatic time-drift and temperature-drift calibrating technology for ultra-high speed DAC sampling window

Abstract

The invention discloses an automatic time-drift and temperature-drift calibrating technology for an ultra-high speed DAC sampling window and provides an automatic correction technology for eliminating drift of the sampling window caused by changes of physical hardware characteristics resulting from temperature and time, power of an automatic calibration single-tone signal is acquired in real time through a signal coupling channel, a signal filtering channel, power control and high-precision acquisition, and finally the sampling window is automatically calibrated through control software. Because a feedback monitoring is carried out on an output signal by the technology, the drift of the sampling window caused by temperature and time can be calibrated in real time, and the method overcomes the defects of time drift, temperature acquisition errors and calibration blindness. The technology has the advantages of being capable of being improved on multiple platforms, high in transferability, low in cost, high in flexibility and the like and makes a high speed modulator platform capable of working in severe environments.

Description

technical field [0001] The invention relates to the technical field of terahertz communication, in particular to a technology for automatically calibrating ultra-high-speed DAC sampling window time drift and temperature drift. Background technique [0002] At present, the baseband code rate in the field of terahertz communication technology is higher than that in other communication fields. Therefore, after the direct digital up-conversion of the baseband digital signal, the baseband part needs to be able to achieve a single-chip sampling rate of 8Gsps, a resolution of 12bit, and a direct synthesis bandwidth above 2.5GHz. modulation signal. In high-speed circuits, because the physical characteristics of high-speed chips and printed board materials change with temperature and time, it will cause unpredictable offsets between the trigger edge of the sampling clock and the effective signal (ie, the sampling window). [0003] In the high-speed modulator with a sampling rate of ...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved and the technical task proposed by the present invention are to improve the existing technology, provide a technology for automatically calibrating the time drift and temperature drift of the ultra-high-speed DAC sampling window, and solve the temperature problem caused by the ultra-high-speed DAC sampling window in the current technology. The problem that drift and time drift cannot be automatically calibrated in real time

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