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High-precision measurement device for radiometer diaphragm area

A measurement device and high-precision technology, applied in the field of optical radiation measurement, can solve the problems of measurement accuracy, cumbersome measurement process, complex measurement device, etc., to achieve the effect of simple measurement process, simplified experimental process, and reduced system uncertainty

Inactive Publication Date: 2014-02-19
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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AI Technical Summary

Problems solved by technology

[0006] The present invention aims to solve the technical problems in the prior art that the measurement device is relatively complicated, the measurement process is cumbersome, and the measurement accuracy is easily affected, and provides a high-precision measurement device for the aperture area of ​​the radiometer

Method used

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  • High-precision measurement device for radiometer diaphragm area
  • High-precision measurement device for radiometer diaphragm area
  • High-precision measurement device for radiometer diaphragm area

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Embodiment Construction

[0024] Invention idea of ​​the present invention is:

[0025] Aiming at the complex characteristics of the effective area method measuring device, an improved measuring device is proposed. The original single laser light source is replaced by a light source system with uniform illumination by stacking semiconductor lasers to directly form a light area with uniform illumination. The aperture stop is placed in this light area, and the radiation flux is measured with an integrating sphere detector. According to The principle formula of the effective area method is A=Φ / E, to find the area of ​​the aperture stop.

[0026] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0027] Such as figure 2 Shown, the measurement process of the high-precision measuring device of the radiometer aperture area of ​​the present invention is:

[0028] Firstly, place the aperture diaphragm on the support frame 10, and adjust the support frame...

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Abstract

The invention belongs to the optical radiation measurement field, and relates to a high-precision measurement device for a radiometer diaphragm area. The high-precision measurement device is an improvement of an active area method measurement device. The high-precision measurement device is formed by main components such as an even-illumination light source system achieved by stacking semiconductor lasers, a sample supporting frame, an integrating sphere and a detector. The high-precision measurement device has the advantages that the measurement process is simplified, the system uncertainty caused by each component in a complex measurement device is reduced, the diaphragm area is indirectly measured, the measured diaphragm area is an active area or radiation calculating area rather than a diaphragm mechanical area, and great improvement significances are achieved for practical application of diaphragm area measurement. The high-precision measurement device can be suitable for various systems requiring precise diaphragm area measurement, and is not just limited in measurement on the radiometer diaphragm area.

Description

technical field [0001] The invention relates to the field of optical radiation measurement, in particular to a high-precision measuring device for the diaphragm area of ​​a radiometer. Background technique [0002] Some radiological and photometric measurements are based on high-precision measurement of the area of ​​the precision diaphragm. The measurement accuracy of the area is an important factor that limits the measurement accuracy of radiometers and photometers, because the size of the aperture diaphragm limits the geometric area of ​​​​the incident light. , determines the incident area and the solid angle of the radiance when calculating the irradiance, so it is of great significance to measure the area of ​​the aperture diaphragm with high precision. [0003] At present, there are many devices for measuring the area of ​​the aperture stop. The more common one with high measurement accuracy is the measuring device of the effective area method, such as figure 1 . The...

Claims

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Application Information

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IPC IPC(8): G01B11/28
Inventor 方伟陈祥子杨振岭
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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