Data acquisition device, on-line simulation debugging system and on-line simulation debugging method

Abstract

The invention relates to a data acquisition device, an on-line simulation debugging system and an on-line simulation debugging method. The data acquisition device comprises an acquisition control circuit and an acquisition circuit. The acquisition control circuit is used for collecting parameters according to preset port data to control data acquisition of the acquisition circuit. The acquisition circuit is used for collecting data in corresponding time frames under the control of the acquisition control circuit, and transmitting the collected data to a random access memory in a micro-processing unit. The acquisition circuit comprises a port selection circuit, a clock selection circuit and a data acquisition and transmission circuit, wherein the port selection circuit is used for selecting sampling ports, the clock selection circuit is used for selecting whether to trigger a port clock or a sampling clock, and the data acquisition and transmission circuit is used for storing the port data of the micro-processing unit and transmitting the port data to the random access memory in the micro-processing unit.

Description

technical field [0001] The present invention relates to the field of simulation debugging of micro-processing units or embedded systems, in particular to an online simulation debugging system and method for realizing monitoring of a micro-processing unit port for a period of continuous time in low-cost and simple online simulation debugging, and the data used for monitoring acquisition device. Background technique [0002] In the prior art, the logic analysis circuit in the FPGA can realize the collection of port data for a period of time. like figure 1 Shown is one of the structural block diagrams of the data acquisition device in the prior art. The logic analysis circuit of the data acquisition device is composed of a state machine circuit, a counting circuit, a multiplex circuit, a register and a storage circuit, such as figure 2 Shown is the second structural block diagram of the logic analysis circuit in the data acquisition device in the prior art. The logic analy...

AI Technical Summary

Problems solved by technology

In this case, additional test equipment is required, which increases the cost and complexity of debugging; in addition, the use of test equipment is affected by the complexity of the circuit system of the micro-processing unit under test

If the circuit system of the micro-processing unit to be tested is relatively complex, there will be a situation where the probe of the test equipment cannot be connected to the chip port for testing, so that the debugging cannot be carried out; in addition, the test equipment itself will have a certain influence on the circuit, such as testing The probe itself has a capacitive effect, which will affect the timing of the microprocessing unit port

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