Microscopy method and device for controlled high-speed chromatography phase position
A high-speed layer and phase technology, applied in the field of optical super-resolution microscopy, can solve the problems of single control and insufficient data acquisition speed, and achieve the effects of stable system, strong controllability, improved sampling speed and operation controllability
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[0045] Such as figure 1 As shown, a high-speed controllable tomographic phase microscopic device includes: a laser 1, a beam expander 2, a mirror 3, a half-wave plate 4, a first polarization beam splitter prism 5, a mirror 6, and a focusing Lens 7, piezoelectric ceramic control mirror 8, collimating lens 9, two-dimensional scanning system 10, scanning lens 11, converging lens 12, sample 13, microscope objective lens 14, mirror 15, microscope field lens 16, second Polarization beam splitter prism 17, polarizer 18, CCD19; As figure 2 As shown, the two-dimensional scanning system 10 is composed of a one-dimensional scanning lens 101 , a lens 102 , a lens 103 and a one-dimensional scanning lens 104 .
[0046] Wherein, the laser 1 emits a laser beam, the beam expands through the beam expander 2 and irradiates on the reflector 3, the laser reflected by the reflector 3 transmits a half-wave plate 4, and irradiates on the first polarizing beam splitter prism 5, By adjusting the ang...
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