Selective Ion Screening Time-of-Flight Mass Analyzer and Its Realization Method and Application

A mass analyzer and time-of-flight technology, applied in the direction of time-of-flight spectrometer, ion source/gun, particle separator tube parts, etc., can solve the problems of increasing the cost and complexity of the instrument, and achieve the improvement of dynamic range, Good effect, simple and convenient effect

Active Publication Date: 2016-06-29
SHANGHAI UNIV +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Several existing ion screening methods will increase the cost and complexity of the instrument to a certain extent

Method used

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  • Selective Ion Screening Time-of-Flight Mass Analyzer and Its Realization Method and Application
  • Selective Ion Screening Time-of-Flight Mass Analyzer and Its Realization Method and Application

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Embodiment Construction

[0021] like figure 1 As shown, a selective ion screening time-of-flight mass analyzer includes a repulsion zone 1, an acceleration zone 2, a field-free drift zone 3, a reflection zone 4 and a detection zone 5 connected in sequence, and the repulsion zone 1 and the reflection zone 4 and the detection area 5 are combined and arranged in a "V" shape. After the ions enter the repulsion zone 1, a pulse repulsion voltage is applied in the repulsion zone 1, and the ions are introduced into the acceleration zone 2. When the ions are introduced into the repulsion zone 1, the introduction direction is perpendicular to the ion repulsion and acceleration direction. The ions drift in the field-free drift region 3 after being accelerated, and then enter the reflection region 4 .

[0022] In order to separate the ions to be measured from the ions to be screened, the reflection plate 6 in the reflection area 4 introduces a sequential pulse voltage. When the ions to be measured pass through t...

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Abstract

The invention relates to a time-of-flight mass analyzer with selective ion screening-out. The analyzer comprises a repulsion area, an acceleration area, a field-free drift area, a reflection area and a detection area which are connected in sequence, wherein the repulsion area, the reflection area and the detection area are in V-shaped combined arrangement, the reflection area is internally provided with a reflecting plate, and time sequence impulse voltage is led to the reflecting plate. The invention also relates to an implementation method and application of the time-of-flight mass analyzer with selective ion screening-out. According to the time-of-flight mass analyzer with selective ion screening-out, the time sequence impulse voltage is accessed to the reflecting plate, ions to be detected are reflected to the detection area, and ions that need to be screened out are guided to the reflecting plate in an accelerating manner and conducted away, thereby realizing screening-out of background or gas-carrying ions, facilitating elimination of interference of the gases to mass spectrum detection, increasing the dynamic range of a detector, and greatly prolonging the service life of the detector (MCP), and the method is easy and convenient to realize, has good effects, and is low in cost. The time-of-flight mass analyzer with selective ion screening-out can be applied to detection of gas analysis instruments.

Description

technical field [0001] The invention relates to analysis instrument detection technology, in particular to a time-of-flight mass analyzer for selective ion screening and its realization method and application. Background technique [0002] The time-of-flight mass analyzer (time-of-flight mass analyzer) determines the mass-to-charge ratio of different ions according to the flight time in vacuum. It has the advantages of fast analysis speed, high mass accuracy, and simultaneous detection of the whole spectrum. Among them, the rapid full-spectrum detection capability is one of the main advantages of the time-of-flight mass analyzer, but in some special application fields, the function of full-spectrum simultaneous detection is not conducive to the application of the time-of-flight mass analyzer, such as the detection of gas components containing carrier gas , the large number of ions generated by carrier gas ionization in such applications will interfere with mass spectrometric...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/40H01J49/10
Inventor 莫婷黄正旭高伟朱辉谭国斌周振
Owner SHANGHAI UNIV
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