Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Wafer-level packaging structure, forming method thereof, and packaging method

A technology of wafer-level packaging and packaging methods, which is applied in the direction of radiation control devices, etc., can solve problems such as grain damage and adverse effects on image sensor performance, and achieve the effect of improving performance

Active Publication Date: 2017-01-11
CHINA WAFER LEVEL CSP
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, in the prior art, after the packaging cover is separated from the die in advance, subsequent processes such as etching and cleaning during the packaging process will cause certain damage to the die, which will adversely affect the performance of the image sensor.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wafer-level packaging structure, forming method thereof, and packaging method
  • Wafer-level packaging structure, forming method thereof, and packaging method
  • Wafer-level packaging structure, forming method thereof, and packaging method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] It can be seen from the background technology that after the image sensor is packaged in the prior art, it is necessary to peel off the package cover from the die. How to separate the package cover from the die without damaging the die is an urgent problem to be solved at present. .

[0040] In order to solve the above problems, the wafer-level packaging structure and packaging method of image sensors are studied, and a packaging method including the following steps is proposed: Step S1, providing a wafer to be packaged, the wafer to be packaged includes a chip area and a dicing line area , the wafer to be packaged includes a first surface and a second surface opposite to the first surface, and a bonding pad and a photosensitive element are formed on the chip area of ​​the first surface of the packaging wafer; step S2, forming a Dike structure on the surface of the dicing line area; step S3, forming a packaging cover opposite to the wafer to be packaged, the packaging c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A wafer-level packaging structure and its forming method, as well as a packaging method, wherein the wafer-level packaging structure includes: a wafer to be packaged including several chip areas and dicing line areas between the chip areas, and the wafer to be packaged It includes a first surface and a second surface opposite to the first surface; a bonding pad and a photosensitive element located on the first surface of the wafer chip area to be packaged; a first embankment structure covering the surface of the bonding pad and the dicing line area, located A second dike structure above the dike structure, the width of the second dike structure is smaller than the width of the first dike structure, and the position of the second dike structure corresponds to the position corresponding to the cutting line area; and the to-be-packaged The first surface of the wafer is opposite to the packaging cover, and the packaging cover is fixedly bonded to the wafer to be packaged through the first dike structure and the second dike structure. The invention automatically separates the packaging cover from the wafer to be packaged at the end of the packaging process, so that the performance of the chip formed after the packaging process is more superior.

Description

technical field [0001] The invention relates to semiconductor packaging technology, in particular to a wafer-level packaging structure, a forming method thereof, and a packaging method. Background technique [0002] An image sensor is a sensor that senses external light and converts it into an electrical signal. After the image sensor chip is manufactured, a series of packaging processes are performed on the image sensor chip to form a packaged image sensor for use in various electronic devices such as digital cameras and digital video cameras. [0003] The traditional image sensor packaging method is usually packaged by wire bonding (Wire Bonding). However, with the rapid development of integrated circuits, longer leads make the product size unable to meet the ideal requirements. Therefore, wafer-level packaging (WLP: Wafer Level Package) has gradually replaced wire bonding packaging as a more commonly used packaging method. Wafer-level packaging technology is a technolog...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/146
Inventor 刘张波王之奇喻琼王蔚
Owner CHINA WAFER LEVEL CSP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products