Separated imaging method for superimposed targets based on multi-spectrum X rays

Abstract

The invention provides a separated imaging method for superimposed targets based on multi-spectrum X rays. Imaging equipment sequentially comprises an X ray source, an imaging object, an X ray detector, a CCD (Charge Coupled Device), a data analyzing and processing device and terminal output equipment, which are put by an order. First, multiple X ray images are respectively shot for the imaging object in the same field of view through the change of the voltage of the X ray source. The imaging processes of the multiple X ray images are respectively described in combination of an X ray attenuation imaging formula and the gradation of the image so as to establish an X ray attenuation imaging equation set. The X ray attenuation imaging equation set is solved by an independent component analysis technology so as to obtain the attenuation thickness of the superimposed targets. The three-dimensional image of each superimposed target is reconstructed according to the thickness of the superimposed targets, that is, the superimposed targets in the original imaging object are separately imaged. Compared with a conventional X ray imaging method, the method has the advantages that the visual effect of the images is improved, and the medical diagnosis accuracy is improved.

Description

technical field [0001] The invention relates to diagnosis and detection by using X-ray imaging in the fields of medical imaging and non-destructive testing, and specifically relates to a new technology of X-ray stereoscopic imaging. Background technique [0002] X-rays are widely used in medical diagnosis, industrial flaw detection and non-destructive testing. A typical X-ray imaging system is mainly composed of an X-ray source, an X-ray detector, a data processing unit, and an image output device. An X-ray image is formed by recording the attenuated X-ray intensity that penetrates an object. The material attenuation coefficient varies with the ray energy and is determined by the chemical composition of the material. The X-ray attenuation of high atomic number materials is significantly greater than that of low atomic number materials, resulting in high contrast of X-ray images of high atomic number materials and low image contrast of low atomic number objects. Therefore, ...

AI Technical Summary

Problems solved by technology

The X-ray attenuation of high atomic number materials is significantly greater than that of low atomic number materials, resulting in high contrast of X-ray images of high atomic number materials and low image contrast of low atomic number objects

Therefore, low atomic number materials are easily obscured by materials superimposed on top of them in an X-ray image

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