Linear laser scanning three-dimensional contour measuring method and device

A technology of three-dimensional profile and measurement method, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems affecting measurement accuracy and efficiency, objects cannot move freely, increase instability, etc., and achieve accurate and fast measurement and simple structure , a wide range of effects

Active Publication Date: 2014-07-02
SUZHOU JIANGAO OPTOELECTRONICS TECH
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Problems solved by technology

However, in practical applications, in many cases, objects cannot move freely, or using motors to drive objects to move will also bring mechanical errors, affect measurement accuracy and efficiency, increase instability, and limit its application range

Method used

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  • Linear laser scanning three-dimensional contour measuring method and device
  • Linear laser scanning three-dimensional contour measuring method and device

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Embodiment Construction

[0023] The present invention will be specifically introduced below in conjunction with the accompanying drawings and specific embodiments.

[0024] Such as figure 1 As shown, the object 3 is placed on the horizontal reference plane, and the word-line laser 1 swings under the control of the magnetostrictive micro-displacement controller 2 to form a scanning surface for the detected object 3. The swing angle ω is determined by the size of the object 3 It is determined that the selection principle of the oscillating angle is to ensure that the word-line laser 1 completely scans the outline of the detected object 3 . During the scanning process, the device obtains the height information of each contour point on the surface of the object 3 to reconstruct the three-dimensional surface contour of the object 3 .

[0025] Specifically, as figure 1 As shown, assuming that the ray OAF perpendicular to the horizontal reference plane is diffusely reflected by the horizontal reference pla...

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Abstract

The invention discloses a linear laser scanning three-dimensional contour measuring method and device. A linear laser device swings under the control of a magnetostriction micrometric displacement controller to form a scanning surface on a detected object, the swing angle omega is determined by the size of the object, and it is guaranteed that the linear laser device completely scans the contour of the detected object; then height information of all contour points is acquired, and the three-dimensional surface contour of the object is reestablished. The linear laser scanning three-dimensional contour measuring method and device have the advantages that in the method, the object does not need to move, the laser device is controlled by the magnetostriction micrometric displacement controller to swing to completely scan the contour of the object, after light rays on which diffuse reflection is conducted by the surface contour of the object are received by an imaging module, the height information of all the points on the surface contour of the object can be acquired, the three-dimensional surface contour of the surface of the object is reestablished, the range and the angle of the laser scanning surface can flexibly change according to the size of the object, measurement is accurate and quick, accuracy is high, the application range is wide, and the three-dimensional contour measuring device is simple in structure and convenient to operate.

Description

technical field [0001] The invention relates to the technical field of three-dimensional profile measurement, in particular to a method for scanning an object by using a magnetostrictive micro-displacement device to control a line laser to realize three-dimensional profile measurement of the object and a device based on the method. Background technique [0002] At present, in many industrial application fields, such as aerospace, profiling, machine vision, etc., it is necessary to obtain the three-dimensional contour information of the object. Three-dimensional profile measurement technology can generally be divided into contact measurement and non-contact measurement. Contact measurement generally uses probes for measurement. Since its accuracy is limited by the size of the probe, and the probe is easy to wear and the probe will cause damage to the measured object, it is more and more inclined to use non-contact measurement in industrial applications. contour measurement m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 林斌张汝婷
Owner SUZHOU JIANGAO OPTOELECTRONICS TECH
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