A test system and method for accurately measuring dielectric constant

Abstract

The invention relates to a test system for accurately measuring dielectric constants. The test system comprises an antenna part, a radio-frequency circuit part and a data processing and displaying part. The antenna part comprises a testing antenna and a scattering sample, the radio-frequency circuit part comprises a radio-frequency signal source and a radio-frequency circuit, and the radio-frequency circuit is composed of a directional coupler, a low noise amplifier, a power divider, a mixer and a low pass filter. The data processing and displaying part is composed of an amplifying circuit and an ARM development board. Electromagnetic parameters of the sample are accurately measured with changes of the input impedance of an antenna and a radiation field. The test system has the advantages that low dielectric constant materials and high dielectric constant materials can be accurately measured, errors are small, the testing system is simple, integration is convenient to achieve, the scattering sample is simple in shape and easy to machine, and sweep testing can be carried out on the scattering sample.

Description

technical field [0001] The invention belongs to the field of microwave measurement, and in particular relates to a method for accurately measuring the electromagnetic parameters (dielectric constant and loss) of a sample by using the change of antenna input impedance and the radiation field. Background technique [0002] With the development of microwave technology, there are more and more demands for microwave components in the fields of aerospace, military and civilian, digital communication, scientific research, etc., so that microwave materials, microwave dielectric substrates and components are constantly being developed. These materials have been played an increasingly important role. Microwave materials are now used in various microwave products. As people study microwave frequency bands are getting higher and higher, microwave devices are getting smaller and smaller. New materials are constantly inventing and appearing, and the data required by the process is also in...

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Problems solved by technology

[0025] According to the above-mentioned several commonly used dielectric constant measurement methods, the existing methods generally can only accurately measure low dielectric constant or high dielectric constant, and cannot achieve simultaneous accurate measurement, and some methods of testing systems or samples The production is relatively cumbersome, the processing cost is high, and it is difficult to produce

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