Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Scratch mask repairing device and method

A mask and repair fluid technology, which is applied in the field of scratch mask repair devices, can solve the problems of high cost and long mask repair cycle, and achieve the effects of complete functions, shortened repair cycle, and low cost

Active Publication Date: 2018-08-24
SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
View PDF19 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a scratch mask repairing device and method that can be applied to the inside of a photolithography machine to overcome the problems of long mask repairing period and high cost in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Scratch mask repairing device and method
  • Scratch mask repairing device and method
  • Scratch mask repairing device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that all the drawings of the present invention are in simplified form and use inaccurate scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0027] Please refer to Figure 1~4 , the present invention provides a scratch mask repairing device, including a bracket device 1 , a defect detection device 2 , a control module (not shown) and a repairing module 3 . Wherein, the support device 1 is installed in the photolithography chamber for fixing the scratched mask, and the defect detection device 2 and the repair module 3 are both installed on the support device 1 . Specifically, the support device 1 can be suspended in any free space of the lit...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention discloses a scratched mask repair apparatus and a method. The apparatus comprises a bracket device, a defect detection device and a repair module, wherein the bracket device is arranged in a photolithography machine chamber, the defect detection device and the repair module are arranged on the bracket device, and the repair module comprises a plurality of repair refills with different sizes. According to the present invention, the bracket device of the scratched mask repair apparatus is directly arranged in the photolithography machine chamber, and can timely and rapidly perform repair in the photolithography machine during mask scratching without influence on productivity of the photolithography machine, such that the function of the photolithography machine is complete, the automation degree of the photolithography machine is high, the mask repair can be directly completed in the photolithography machine, and the internal space of the photolithography machine is completely utilized so as to substantially shorten the repair period and provide characteristics of simpleness, rapidness, low cost, and no influence on productivity.

Description

technical field [0001] The invention relates to the field of photolithography machine manufacturing, in particular to a scratch mask repairing device and method applicable to the interior of a photolithography machine. Background technique [0002] In the LCD (liquid crystal display) manufacturing industry, the lithography process of the color filter requires the use of a lithography machine. Because the price of the proximity lithography machine is much lower than that of the step-and-scan lithography machine, it can also meet the requirements of the color filter. The various characteristics and specifications of the film, so the lithography process of the industry's color filters uses proximity lithography equipment. However, in the actual production process, due to the small gap between the mask of the proximity lithography machine and the product on the stage, generally below 300um, the mask is easily polluted and scratched. After contamination, it can be cleaned in the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G03F1/72G03F7/20
Inventor 李会丽闻人青青张俊李志丹
Owner SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products