Irradiation bias system based on static random access memory (SRAM)

Abstract

The invention relates to an irradiation bias system based on a static random access memory (SRAM). The system consists of an irradiation circuit module, an excitation output module, a data processing module, an error display module, a read-write control module, a download configuration module, a precise power supply and a lead shielding room. According to the irradiation bias system, a flash memory is taken as a data carrier, and a field programmable gate array (FPGA) is taken as a control center, so that the irradiation bias system can independently work in an off-line way. After a lead shielding method is adopted, signal stimulus needed by read operation and write operation is directly provided for the SRAM in a source of radiation, so that the true working circumstance of the SRAM in the space radiation environment is simulated, and the irradiation bias system has significance for the intensive study of the radiation damage mechanism of the SRAM. Furthermore, the configuration of signals at an output port is changed according to the requirements, so that the irradiation bias system is suitable for irradiation experiments of the existing SRAMs with all models. The defects that the existing structure is complicated, the signals of the system are poor in integrity, and the operation is troublesome can be overcome.

Description

technical field [0001] The invention relates to an irradiation biasing system based on a static random access memory, which belongs to the biasing of a space radiation environment simulation experiment, and in particular relates to the biasing of a static random access memory in an irradiation experiment and the detection of its storage function. Background technique [0002] SRAM is widely used in the control systems of spacecraft and satellites due to its low power consumption and fast access speed. Its reliability will directly determine the normal operation and service life of spacecraft and satellites in orbit. However, there are a large number of high-energy radiation particles in the space environment, and their action on the SRAM will cause serious degradation of its working performance, such as: noise margin reduction, power consumption current increase, etc. In order to simulate the real working conditions of SRAM devices in the space radiation environment and deep...

AI Technical Summary

Problems solved by technology

The present invention integrates the functions of the previous system, and improves its complex structure, not only greatly improving the problems of poor signal integrity and troublesome operation in the existing system, but also simulating the real situation of SRAM devices working in the space radiation environment , the in-depth study of the radiation damage mechanism of SRAM is of great significance

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