Double-beam splitting system

A spectroscopic system and double-beam technology, applied in spectrometry/spectrophotometry/monochromator, optical radiation measurement, using diffraction elements to generate spectra, etc., can solve problems such as high cost, measurement errors, and large volume. Achieve volume reduction, avoid measurement errors, and facilitate miniaturization

Inactive Publication Date: 2014-08-13
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to propose a dual-beam splitting system, which solves the problems of large volume and high cost and

Method used

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Examples

Experimental program
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Example Embodiment

[0019] Example 1: See attached figure 1 The dual beam splitting system of the present invention includes an incident slit I1, an incident slit II2, a diffraction grating, and a detector. The incident slit I1 and the incident slit II2 are arranged side by side in the length direction, that is, perpendicular to the dispersion direction, respectively The sample light and reference light input from the incident slit I1 and the incident slit II2 are respectively dispersed by the diffraction grating, and the sample beam spectrum 5 and the reference beam spectrum 6 after being dispersed by the diffraction grating are arranged side by side on the detector without interfering with each other, so that A beam splitting system realizes the function of a double beam splitting system.

[0020] The diffraction grating is a concave grating 3 and the detector is an area array detector 4.

[0021] The distance between the sample beam spectrum 5 and the reference beam spectrum 6 is related to the eff...

Example Embodiment

[0022] Embodiment two:

[0023] See attached figure 2 The difference between this embodiment and the first embodiment is that the diffraction grating is a concave grating 3, and the detector includes a linear array detector I7 and a linear array detector II8, and the linear array detector I7 and the linear array detector II8 are arranged side by side. The sample beam spectrum 5 and the reference beam spectrum 6 are arranged on the linear array detector I7 and the linear array detector II8, respectively.

[0024] The sample light and reference light incident from the entrance slit I1 and the entrance slit II2 are dispersed by the concave grating 3. The sample beam spectrum 5 and the reference beam spectrum 6 are received by the linear array detector I7 and the linear array detector II8, respectively. The beam spectrum 5 and the reference beam spectrum 6 are arranged side by side without interfering with each other, so that a beam splitting system can realize the function of a doubl...

Example Embodiment

[0026] Example three:

[0027] See attached image 3 The difference between this embodiment and the first embodiment is that the diffraction grating is a plane grating 10, the detector is an area array detector 4, and the beam splitting system further includes a collimator lens 9 and an imaging lens 11; The sample light and reference light incident from the slit I1 and the incident slit II2 are incident on the plane grating 10 as parallel light after passing through the collimator lens 9. After the plane grating 10 is chromatic dispersion, and then converged by the imaging lens 11, the sample beam spectrum 5 and reference The beam spectra 6 are respectively arranged side by side on the area array detector 4 without interfering with each other, so that a single beam splitting system can realize the function of a double beam splitting system.

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Abstract

The invention provides a double-beam splitting system, and belongs to the field of spectrum instrument design. The double-beam splitting system aims at solving the problems that in the prior art, the size is large, the cost is high, and measurement errors are caused by spectrum overlapping. The double-beam splitting system comprises an entrance slit I, an entrance slit II, a diffraction grating and a detector, wherein the entrance slit I and the entrance slit II are arrayed in the length direction, chromatic dispersion is conducted on sample light input through the entrance slit I and reference light input through the entrance slit II respectively through the diffraction grating, and the spectrum of the sample light beam where chromatic dispersion is conducted through the diffraction grating and the spectrum of the reference light beam where chromatic dispersion is conducted through the diffraction grating are arrayed on the detector side by side. According to the double-beam splitting system, the sample light input through the entrance slit I and the reference light input through the entrance slit II are arrayed in the length direction side by side, the spectrum of the sample light beam and the spectrum of the reference light beam are obtained through the diffraction grating and the detector, and therefore the functions of two beam splitting systems are achieved through one beam splitting system, overlapping or crosstalk can not happen to the two light beams, and the problem of measurement errors caused by light beam overlapping is avoided.

Description

technical field [0001] The invention belongs to the field of spectroscopic instrument design, and in particular relates to a double-beam spectroscopic system. Background technique [0002] A spectrophotometer is a combination of a spectroscopic instrument and a photometer, and is the most widely used spectroscopic instrument. The use of spectrophotometers for qualitative and quantitative analysis has the advantages of high analysis accuracy, wide measurement range, fast analysis speed, less analysis sample consumption, no damage, and no change in the physical and chemical characteristics of the sample. It is widely used in industrial and agricultural production and It has been widely used in biochemical, medical and other fields, and has become a powerful tool for exploring nature, transforming nature, developing science and technology and production. [0003] The typical components of a spectrophotometer are: light source and lighting system, spectroscopic system and detec...

Claims

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Application Information

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IPC IPC(8): G01J3/28G01J3/02G01J3/04G01J3/18
Inventor 颜昌翔刘怡轩
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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