Magneto-optical modulation reflection spectrum device based on Fourier transform infrared spectrometer

Abstract

The invention discloses a magneto-optical modulation reflection spectrum device based on a Fourier transform infrared spectrometer. The device comprises a Fourier modulation and transformation system, a low-temperature optical magnetic field system, a light modulation and detection system and a light path coupling and detecting system. Based on the light path and circuit contact among the systems, a magneto-optical modulation reflection spectrum method based on a step scanning Fourier transform infrared spectrometer is provided, so that the magneto-optical modulation reflection spectrum measurement under experiment conditions of low temperature and a variable magnetic field can be realized, the adverse effects of luminescence induced by diffuse reflection pumping light and sample light can be overcome, the detecting and processing capacity on weak signals is improved andsemiconductor faint light modulation properties can be effectively detected under the conditions of low temperature and a high-intensity magnetic field.

Description

Technical field: [0001] The invention relates to a semiconductor material magneto-optical-optical modulation reflection spectrum testing method and device. Specifically, it is mainly based on the step-scan function of the Fourier transform infrared (Fourier Transform Infrared, FTIR) spectrometer and the external pump light modulation, and realizes the device for measuring the light-modulated reflectance spectrum of the photoelectric material placed in the low-temperature optical magnet Dewar It has the function of accurately, fully and non-destructively characterizing the electronic band structure and parameters of semiconductors. Background technique: [0002] The extreme conditions of low temperature and high magnetic field have always played a vital role in the research of semiconductor materials and devices. Applying a magnetic field to the semiconductor material causes the time-reversal symmetry to break, which can reflect the energy state structure changes such as the...

AI Technical Summary

Problems solved by technology

[0003] Traditional PR testing technology is limited in two aspects: (1) pump light diffuse reflection signal and pump light-induced PL signal lead to false signals and detector sensitivity limitations; (2) can only work in short-wavelength bands below 5 microns

The optical measurement of PR under low temperature and strong magnetic field will become particularly difficult: (1) the large volume of the magnet and its container makes it impossible to conveniently adjust and optimize the position of the sample in the optical path; (2) the gap between the magnet and the spectral testing system Sufficient distance must be kept to ensure that the mechanical and optoelectronic components in the spectrometer are not disturbed by strong magnetic fields

This makes the reality that magneto-optic-PR is extremely difficult, and the mid-to-far infrared band cannot be implemented due to mechanism limitations.

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