Testing method and system of clock chip

Abstract

The invention, which relates to the integrated circuit testing field, discloses a testing method and system of a clock chip. According to the invention, on the basis of the clock chip testing principle, a testing load plate and a tested device interface are designed and arranged. When the memory of the clock chip works normally, the precision of the crystal oscillator frequency can be tested; a high-precision frequency meter is used for measuring the crystal oscillator frequency in a working temperature range of the clock chip; a temperature compensation value of the crystal oscillator frequency in the working temperature range of the clock chip is calculated according to the measuring value and is stored into the memory of the clock chip; and the temperature compensation value is read, and when the read value meets a predetermined simulated curve, that the clock chip passes the temperature compensation test successfully is determined. Therefore, temperature compensation testing is realized in a wide temperature range from minus 40 DEG C to 85 DEG C for the crystal oscillator frequency of the clock chip; and the clock precision is improved.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a clock chip testing method and system. Background technique [0002] The clock chip is a built-in 32.768kHz crystal oscillator, with I 2 The C bus interface is a communication mode. In addition to calendar and clock functions, it also has functions such as alarm, fixed-period timing interrupt, time update interrupt and enabling OE 32.768kHz frequency output. The details are as follows: [0003] 1. Real-time clock function: This function is used to set and read the time information of year, month, day, week, hour, minute, and second. The year is represented by the last two digits. Any year that can be divisible by 4 is regarded as a leap year deal with; [0004] 2. Timing interrupt function: The fixed-period timer interrupt function can generate a fixed-period interrupt event, and the fixed period can be set at any time between 244.14uS and 4095 minutes; [0005] 3. T...

AI Technical Summary

Problems solved by technology

Because the temperature compensation test is not performed, it is very likely that the accuracy of the clock chip in some temperature ranges is not reliable, so that the clock chip cannot work reliably in a wide temperature range

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