Test circuit used for intelligent power module and test method thereof

Abstract

The invention belongs to the technical field of a power semiconductor test, and provides a test circuit used for an intelligent power module and a test method thereof. After the intelligent power module is accessed to an interface module, a test control module controls multiple switches in a switch array module according to model number and parameter test requirements of the intelligent power module so that corresponding connection and disconnection are realized. The connection and disconnection states of the multiple switches are corresponding to the model number and parameter test requirements of the intelligent power module. The test control module drives a parameter test module to output an excitation signal to be loaded to the intelligent power module via the switch array module and the interface module, and a response signal outputted by the intelligent power module is detected by the parameter test module via the interface module and the switch array module and corresponding electrical parameters are recorded so that an objective that intelligent power modules with different model numbers are compatible on the basis of realization of different electrical parameter tests on the intelligent power module, and a test function is substantially expanded.

Description

technical field [0001] The invention belongs to the technical field of power semiconductor testing, and in particular relates to a testing circuit and testing method for an intelligent power module. Background technique [0002] The intelligent power module is a hybrid integrated circuit that integrates power semiconductor devices, gate drive circuits, and protection circuits. It is widely used in the fields of frequency conversion home appliances, inverter power supplies, and industrial electrical automation. [0003] As the core device in the electronic system, the intelligent power module often works in the environment of high voltage and high current, and its performance directly affects the reliability of the electronic system. Therefore, it is of great significance to improve the reliability of the system to test the various electrical parameters of the intelligent power module and eliminate unqualified products. However, due to the large number of parameters of the i...

AI Technical Summary

Problems solved by technology

However, due to the large number of parameters of the intelligent power module and the different models, the existing technology generally designs a special test circuit for the intelligent power module based on its internal structure and external pin definitions. Expansion, there is no commonality between the test circuits of different types of intelligent power modules

[0004] Therefore, there is a problem in the prior art that a test circuit for an intelligent power module cannot be provided to accurately detect the electrical parameters of the intelligent power module and facilitate function expansion to be compatible with different types of intelligent power modules

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